arXiv subjects

Jessica Plassmann

Publications and source records attributed to Jessica Plassmann.

3 recordsLinked to original sources

arXiv2025

Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect Detection

Shearography is an interferometric technique sensitive to surface displacement gradients, providing high sensitivity for detecting subsurface defects in safety-critical components. A key limitation to industrial adoption is the lack of high-quality annotated datasets, since manual labeling remains labor-intensive, subjective, and difficult to standardize. We present an automated labeling pipeline that generates candidate defect bounding boxes with Grounded DINO, refines them using SAM masks, and exports YOLO-format labels for downstream detector training. Quantitative evaluation shows the generated boxes are suitable for weakly supervised learning, while high-resolution masks provide qualitative visualization. This approach reduces manual effort and supports scalable dataset creation for robust industrial defect detection.

cs.CV↗

arXiv2025

Unsupervised Learning for Industrial Defect Detection: A Case Study on Shearographic Data

Shearography is a non-destructive testing method for detecting subsurface defects, offering high sensitivity and full-field inspection capabilities. However, its industrial adoption remains limited due to the need for expert interpretation. To reduce reliance on labeled data and manual evaluation, this study explores unsupervised learning methods for automated anomaly detection in shearographic images. Three architectures are evaluated: a fully connected autoencoder, a convolutional autoencoder, and a student-teacher feature matching model. All models are trained solely on defect-free data. A controlled dataset was developed using a custom specimen with reproducible defect patterns, enabling systematic acquisition of shearographic measurements under both ideal and realistic deformation conditions. Two training subsets were defined: one containing only undistorted, defect-free samples, and one additionally including globally deformed, yet defect-free, data. The latter simulates practical inspection conditions by incorporating deformation-induced fringe patterns that may obscure localized anomalies. The models are evaluated in terms of binary classification and, for the student-teacher model, spatial defect localization. Results show that the student-teacher approach achieves superior classification robustness and enables precise localization. Compared to the autoencoder-based models, it demonstrates improved separability of feature representations, as visualized through t-SNE embeddings. Additionally, a YOLOv8 model trained on labeled defect data serves as a reference to benchmark localization quality. This study underscores the potential of unsupervised deep learning for scalable, label-efficient shearographic inspection in industrial environments.

cs.CV↗

arXiv2025

Simulation of Speckle Interferometric Results for Enhanced Measurement and Automated Defect Detection

Techniques like speckle holography and shearography are rarely applied due to the complexity of instrument setup and lack of automated result analysis, despite their potential. By simulating speckle interferometric outcomes, we seek to address these challenges, enabling more efficient measurement processes and paving the way for automated defect recognition. This research focuses on developing a simulation code for speckle interferometric results derived from finite element analyses. The aim is to improve the parameter settings of speckle interferometry measurements and create specific datasets, which will be used to develop machine learning-based methods for automation in series production.

physics.optics↗