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Jia-Ju Wei

Publications and source records attributed to Jia-Ju Wei.

3 recordsLinked to original sources

Simulation of DAMPE silicon microstrip detectors in the $\rm Allpix^{2}$ framework

Silicon strip detectors have been widely utilized in space experiments for gamma-ray and cosmic-ray detections thanks to their high spatial resolution and stable performance. For a silicon micro-strip detector, the Monte Carlo simulation is recognized as a practical and cost-effective approach to verify the detector performance. In this study, a technique for the simulation of the silicon micro-strip detector with the $\rm Allpix^{2}$ framework is developed. By incorporating the electric field into the particle transport simulation based on Geant4, this framework could precisely emulate the carrier drift in the silicon micro-strip detector. The simulation results are validated using the beam test data as well as the flight data of the DAMPE experiment, which suggests that the $\rm Allpix^{2}$ framework is a powerful tool to obtain the performance of the silicon micro-strip detector.

physics.ins-det

Capacitive coupling study of the HERD SCD prototype: preliminary results

The Silicon Charge Detector (SCD) is a subdetector of the High Energy Cosmic Radiation Detection payload. The dynamic range of the silicon microstrip detector can be extended by the capacitive coupling effect, which is related to the interstrip capacitance and the coupling capacitance. A detector prototype with several sets of parameters was designed and tested in the ion beams at the CERN Super Proton Synchrotron. The capacitive coupling fractions with readout strip and floating strip incidences were studied using the beam test data and SPICE simulation.

physics.ins-det

Characterization of silicon microstrip sensors for space astronomy

Silicon microstrip detectors are widely used in experiments for space astronomy. Before the detector is assembled, extensive characterization of the silicon microstrip sensors is indispensable and challenging. This work electrically evaluates a series of sensor parameters, including the depletion voltage, bias resistance, metal strip resistance, total leakage current, strip leakage current, coupling capacitance, and interstrip capacitance. Two methods are used to accurately measure the strip leakage current, and the test results match each other well. In measuring the coupling capacitance, we extract the correct value based on a SPICE model and two-port network analysis. In addition, the expression of the measured bias resistance is deduced based on the SPICE model.

physics.ins-det