Bijectivity analysis of rational T-spline surfaces via Bernstein representations
Ensuring the bijectivity of spline-based parameterizations is fundamental in geometric modeling and isogeometric analysis, as invalid mappings may lead to self-intersections, singular Jacobians, and numerical instability. While T-splines offer enhanced flexibility through local refinement, this flexibility also makes bijectivity verification significantly more challenging. In this work, we propose a rigorous and efficient framework for bijectivity analysis of rational T-spline surfaces based on Bézier extraction. The key idea is to reformulate the T-spline representation into a collection of element-wise rational Bézier patches, on which the Gram determinant of the mapping admits a Bernstein polynomial representation. This enables a coefficient-based analysis of local regularity by exploiting the convex hull and positivity properties of the Bernstein basis. Based on this formulation, we derive a sufficient condition for bijectivity from the nonnegativity of Bernstein coefficients, together with a necessary condition based on the sign consistency of corner coefficients. For cases where these conditions are inconclusive, we introduce a hierarchical subdivision strategy that progressively localizes ambiguous regions and resolves them through refinement. The proposed method provides a certified and adaptive procedure for bijectivity verification that avoids dense numerical sampling and remains computationally efficient. Numerical experiments on complex T-spline geometries demonstrate that the approach accurately detects both valid and near-degenerate configurations, while scaling effectively to large models with thousands of rational Bézier patches. The framework is fully compatible with standard isogeometric analysis workflows.