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Jiang-Jing Wang

Publications and source records attributed to Jiang-Jing Wang.

10 recordsLinked to original sources

Multiscale simulations guided advances for all-optical phase-change waveguides

Photonic computing using chalcogenide phase-change materials (PCMs) is under active development for energy-efficient artificial intelligence (AI) applications. A key requirement is to enable as many optically programmable levels per device as possible, while maintaining relatively low optical loss. In this work, we carry out multiscale simulations using density functional theory and finite-difference time-domain methods, proposing a "the shorter the better" strategy to optimize the performance of Sb2Te photonic waveguide devices. Our subsequent experimental characterizations of Sb2Te thin films and optical device measurements fully verify our theoretical predictions. In particular, we reveal the unconventional optical properties of metastable crystalline Sb2Te, and utilize these features for device design, yielding a simultaneous improvement in both the programming window and the optical loss. Overall, an optical programming precision exceeding 7-bit is achieved using a single waveguide cell, setting a new record for all-optical phase-change memory devices. Our work serves as a compelling example of computational material design, which demonstrates the predictive power of multiscale simulations in guiding the design of phase-change photonic devices for enhanced performance.

cond-mat.mtrl-sci

Percolation-driven $β$ -relaxation enables resonant acceleration of crystallization in amorphous phase-change materials

Amorphous phase-change materials enable fast and reversible switching in optical and electronic devices, yet crystallization kinetics are still controlled primarily through empirical thermal protocols. Here we identify a microscopic picture governing crystallization in the prototypical phase-change material Ge2Sb2Te5, in which crystallization pathways are organized by the percolation of mobile atomic networks associated with $β$-relaxation. We show that this percolation transition distinguishes the dominance of diffusion-driven and diffusionless nucleation and growth during crystallization processes. We further demonstrate that frequency-selected ultrasonic excitation, applied in conjunction with heating, accelerates crystallization by enhancing percolation-mediated atomic dynamics. This acceleration is maximized near the $β$-relaxation frequency, consistent with resonant excitation of mobile atoms. Our results establish a direct link between glassy relaxation, atomic-scale percolation, and crystallization, and introduce a new route to modulating phase-change kinetics through targeted excitation of fundamental glassy dynamics.

cond-mat.mtrl-sci

Atomistic understanding of two-dimensional monatomic phase-change material for non-volatile optical applications

Elemental antimony (Sb) is a promising material for phase-change memory, neuromorphic computing and nanophotonic applications, because its compositional simplicity can prevent phase segregation upon extensive programming. Scaling down the film thickness is a necessary step to prolong the lifetime of amorphous Sb, but the optical properties of Sb are also significantly altered as the thickness is reduced to a few nanometers, adding complexity to device optimization. In this work, we aim to provide atomistic understanding of the thickness-dependent optical responses in Sb thin films. As thickness decreases, both the extinction coefficient and optical contrast reduce in the near-infrared spectrum, consistent with previous optical measurements. Such thickness dependence gives rise to a bottom thickness limit of 2 nm in photonic applications, as predicted by coarse-grained device simulations. Further bonding analysis reveals a fundamentally different behavior for amorphous and crystalline Sb upon downscaling, resulting in the reduction of optical contrast. Thin film experiments are also carried out to validate our predictions. The thickness-dependent optical trend is fully demonstrated by our ellipsometric spectroscopy experiments, and the bottom thickness limit of 2 nm is confirmed by structural characterization experiments. Finally, we show that the greatly improved amorphous-phase stability of the 2 nm Sb thin film enables robust and reversible optical switching in a silicon-based waveguide device.

cond-mat.mtrl-sci

Amorphous phase-change memory alloy with no resistance drift

Spontaneous structural relaxation is intrinsic to glassy materials due to their metastable nature. For phase-change materials (PCMs), the resultant temporal change in electrical resistance seriously hamper in-memory computing (IMC) applications. Here, we report an ab-initio-calculation-informed design of amorphous PCM composed of robust "molecule-like" motifs with minimal Peierls distortion, depriving the amorphous alloy of structural ingredients that would gradually evolve upon aging to entail resistance drift. We demonstrate amorphous CrTe3 thin films that display practically no resistance drift at any working temperature from -200 to 165 degree C. We achieve multilevel programming of CrTe3 through both step-wise crystallization and step-wise amorphization using a hybrid opto-electronic device at various temperatures. Moreover, the application potential of CrTe3 in neuromorphic computing is testified by its incorporation in a vehicle with automatic path-tracking function. Our work opens a new avenue to achieving IMC-requisite properties via judicious design of the composition and atomic-level structure of disordered PCM alloys.

cond-mat.mtrl-sci

Role of seed layer in growing atomically flat TiTe2/Sb2Te3 heterostructure thin films at the wafer scale

Chalcogenide phase-change materials (PCMs) are a leading candidate for advanced memory and computing applications. Epitaxial-like growth of chalcogenide thin films at the wafer scale is important to guarantee the homogeneity of the thin film but is challenging with magnetron sputtering, particularly for the growth of phase-change heterostructure (PCH), such as TiTe2/Sb2Te3. In this work, we report how to obtain highly textured TiTe2/Sb2Te3 heterostructure thin films with atomically sharp interfaces on standard silicon substrates. By combining atomic-scale characterization and ab initio simulations, we reveal the critical role of the Sb2Te3 seed layer in forming a continuous Si-Sb-Te mixed transition layer, which provides a wafer-scale flat surface for the subsequent epitaxial-like growth of TiTe2/Sb2Te3 thin film. By gradually reducing the thickness of the seed layer, we determine its critical limit to be ~2 nm. Non-negligible in-plane tensile strain was observed in the TiTe2 slabs due to the lattice mismatch with the adjacent Sb2Te3 ones, suggesting that the chemical interaction across the structural gaps in the heterostructure is stronger than a pure van der Waals interaction. Finally, we outline the potential choices of chalcogenides for atomically flat seed layers on standard silicon substrates, which can be used for wafer-scale synthesis of other high-quality PCM or PCH thin films.

cond-mat.mtrl-sci

Homopolar Chemical Bonds Induce In-Plane Anisotropy in Layered Semiconductors

Main-group layered binary semiconductors, in particular, the III-VI alloys in the binary Ga-Te system are attracting increasing interest for a range of practical applications. The III-VI semiconductor, monoclinic gallium monotelluride (m-GaTe), has been recently used in high-sensitivity photodetectors/phototransistors and electronic memory applications due to its anisotropic properties yielding superior optical and electrical performance. Despite these applications, the origin of such anisotropy, namely the complex structural and bonding environments in GaTe nanostructures remain to be fully understood. In the present work, we report a comprehensive atomic-scale characterization of m-GaTe by state-of-the-art element-resolved atomic-scale microscopy experiments, enabling a direct measure of the in-plane anisotropy at the sub-Angstrom level. We show that these experimental images compare well with the results of first-principles modeling. Quantum-chemical bonding analyses provide a detailed picture of the atomic neighbor interactions within the layers, revealing that vertical Ga-Ga homopolar bonds get stronger when they are distorted and rotated, inducing the strong in-plane anisotropy. Beyond GaTe, using a systematic screening over the Materials Project database, we identify four additional low-symmetric layered crystals with similar distorted tetrahedral patterns, namely, GeP, GeAs, SiP, and SiAs. We thereby confirm the homopolar-bond-induced anisotropy is a more generic feature in these layered van-der-Waals materials.

cond-mat.mtrl-sci

Spin glass behavior in amorphous Cr2Ge2Te6 phase-change alloy

The layered crystal structure of Cr2Ge2Te6 shows ferromagnetic ordering at the two-dimensional limit, which holds promise for spintronic applications. However, external voltage pulses can trigger amorphization of the material in nanoscale electronic devices, and it is unclear whether the loss of structural ordering leads to a change in magnetic properties. Here, we demonstrate that Cr2Ge2Te6 preserves the spin-polarized nature in the amorphous phase, but undergoes a magnetic transition to a spin glass state below 20 K. Quantum-mechanical computations reveal the microscopic origin of this transition in spin configuration: it is due to strong distortions of the Cr-Te-Cr bonds, connecting chromium-centered octahedra, and to the overall increase in disorder upon amorphization. The tunable magnetic properties of Cr2Ge2Te6 could be exploited for multifunctional, magnetic phase-change devices that switch between crystalline and amorphous states.

cond-mat.mtrl-sci

In situ characterization of vacancy ordering in Ge-Sb-Te phase-change memory alloys

Tailoring the degree of structural disorder in Ge-Sb-Te alloys is important for the development of non-volatile phase-change memory and neuro-inspired computing. Upon crystallization from the amorphous phase, these alloys form a cubic rocksalt-like structure with a high content of intrinsic vacancies. Further thermal annealing results in a gradual structural transition towards a layered structure and an insulator-to-metal transition. In this work, we elucidate the atomic-level details of the structural transition in crystalline GeSb2Te4 by in situ high-resolution transmission electron microscopy (HRTEM) experiments and ab initio density functional theory (DFT) calculations, providing a comprehensive real-time and real-space view of the vacancy ordering process. We also discuss the impact of vacancy ordering on altering the electronic and optical properties of GeSb2Te4, which is relevant to multilevel storage applications. The phase evolution paths in Ge-Sb-Te alloys are illustrated using a summary diagram, which serves as a guide for designing phase-change memory devices.

cond-mat.mtrl-sci

Designing inorganic semiconductors with cold-rolling processability

While metals can be readily processed and reshaped by cold rolling, most bulk inorganic semiconductors are brittle materials that tend to fracture when plastically deformed. Manufacturing thin sheets and foils of inorganic semiconductors is therefore a bottleneck problem, severely restricting their use in flexible electronics applications. It was recently reported that a few single-crystalline two-dimensional van der Waals (vdW) semiconductors, such as InSe, are deformable under compressive stress. Here we demonstrate that intralayer fracture toughness can be tailored via compositional design to make inorganic semiconductors processable by cold rolling. We report systematic ab initio calculations covering a range of van der Waals semiconductors homologous to InSe, leading to material-property maps that forecast trends in both the susceptibility to interlayer slip and the intralayer fracture toughness against cracking. GaSe has been predicted, and experimentally confirmed, to be practically amenable to being rolled to large (three quarters) thickness reduction and length extension by a factor of three. Our findings open a new realm of possibility for alloy selection and design towards processing-friendly group-III chalcogenides for flexible electronic and thermoelectric applications.

cond-mat.mtrl-sci

Progressive amorphization of GeSbTe phase-change material under electron beam irradiation

Fast and reversible phase transitions in chalcogenide phase-change materials (PCMs), in particular, Ge-Sb-Te compounds, are not only of fundamental interests, but also make PCMs based random access memory (PRAM) a leading candidate for non-volatile memory and neuromorphic computing devices. To RESET the memory cell, crystalline Ge-Sb-Te has to undergo phase transitions firstly to a liquid state and then to an amorphous state, corresponding to an abrupt change in electrical resistance. In this work, we demonstrate a progressive amorphization process in GeSb2Te4 thin films under electron beam irradiation on transmission electron microscope (TEM). Melting is shown to be completely absent by the in situ TEM experiments. The progressive amorphization process resembles closely the cumulative crystallization process that accompanies a continuous change in electrical resistance. Our work suggests that if displacement forces can be implemented properly, it should be possible to emulate symmetric neuronal dynamics by using PCMs.

cond-mat.mtrl-sci