arXiv subjects

Jinhan Kim

Publications and source records attributed to Jinhan Kim.

21 records · Page 2Linked to original sources

arXiv2021

Ahead of Time Mutation Based Fault Localisation using Statistical Inference

Mutation analysis can effectively capture the dependency between source code and test results. This has been exploited by Mutation Based Fault Localisation (MBFL) techniques. However, MBFL techniques suffer from the need to expend the high cost of mutation analysis after the observation of failures, which may present a challenge for its practical adoption. We introduce SIMFL (Statistical Inference for Mutation-based Fault Localisation), an MBFL technique that allows users to perform the mutation analysis in advance before a failure is observed, allowing the amortisation of the analysis cost. SIMFL uses mutants as artificial faults and aims to learn the failure patterns among test cases against different locations of mutations. Once a failure is observed, SIMFL requires either almost no or very small additional cost for analysis, depending on the used inference model. An empirical evaluation using Defects4J shows that SIMFL can successfully localise up to 113 out of 203 studied faults (55%) at the top, and 159 (78%) faults within the top five, significantly outperforming existing MBFL techniques while using the results of mutation analysis that has been undertaken before the test failure. The amortised cost of mutation analysis can be further reduced by mutation sampling: SIMFL retains 80% of its localisation accuracy at the top rank when using only 10% of generated mutants, compared to results obtained without sampling.

cs.SE↗

arXiv2020

Reducing DNN Labelling Cost using Surprise Adequacy: An Industrial Case Study for Autonomous Driving

Deep Neural Networks (DNNs) are rapidly being adopted by the automotive industry, due to their impressive performance in tasks that are essential for autonomous driving. Object segmentation is one such task: its aim is to precisely locate boundaries of objects and classify the identified objects, helping autonomous cars to recognise the road environment and the traffic situation. Not only is this task safety critical, but developing a DNN based object segmentation module presents a set of challenges that are significantly different from traditional development of safety critical software. The development process in use consists of multiple iterations of data collection, labelling, training, and evaluation. Among these stages, training and evaluation are computation intensive while data collection and labelling are manual labour intensive. This paper shows how development of DNN based object segmentation can be improved by exploiting the correlation between Surprise Adequacy (SA) and model performance. The correlation allows us to predict model performance for inputs without manually labelling them. This, in turn, enables understanding of model performance, more guided data collection, and informed decisions about further training. In our industrial case study the technique allows cost savings of up to 50% with negligible evaluation inaccuracy. Furthermore, engineers can trade off cost savings versus the tolerable level of inaccuracy depending on different development phases and scenarios.

cs.LG↗

arXiv2018

Guiding Deep Learning System Testing using Surprise Adequacy

Deep Learning (DL) systems are rapidly being adopted in safety and security critical domains, urgently calling for ways to test their correctness and robustness. Testing of DL systems has traditionally relied on manual collection and labelling of data. Recently, a number of coverage criteria based on neuron activation values have been proposed. These criteria essentially count the number of neurons whose activation during the execution of a DL system satisfied certain properties, such as being above predefined thresholds. However, existing coverage criteria are not sufficiently fine grained to capture subtle behaviours exhibited by DL systems. Moreover, evaluations have focused on showing correlation between adversarial examples and proposed criteria rather than evaluating and guiding their use for actual testing of DL systems. We propose a novel test adequacy criterion for testing of DL systems, called Surprise Adequacy for Deep Learning Systems (SADL), which is based on the behaviour of DL systems with respect to their training data. We measure the surprise of an input as the difference in DL system's behaviour between the input and the training data (i.e., what was learnt during training), and subsequently develop this as an adequacy criterion: a good test input should be sufficiently but not overtly surprising compared to training data. Empirical evaluation using a range of DL systems from simple image classifiers to autonomous driving car platforms shows that systematic sampling of inputs based on their surprise can improve classification accuracy of DL systems against adversarial examples by up to 77.5% via retraining.

cs.SE↗