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Jinhao Hu

Publications and source records attributed to Jinhao Hu.

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Don't Trust the Code, Check Its Effects: Runtime Refinement for Regenerated Systems Code Under an Adversarial Generator

Recent work uses large language models to generate systems code from specifications, treating the specification as the durable artifact and the implementation as disposable. Regenerating the implementation specializes it to each workload and device. However, that work lives in a forgiving setting: a component's externally visible effects, its writes and device commands, are recoverable, and the generator is honest, so trust is discharged by re-execution. We target the unforgiving setting: systems code whose effects are irreversible, produced by a generator that may be adversarial. There, re-execution cannot check an effect after the fact, and a proof fails silently when its assumptions do. We take the position that the only safe way to operate here is to deny the generated code the authority to act. The generated code only plans, while a fixed trusted mediator owns every effect and performs one only when the specification would have produced it. Because the guarantee lives in the mediator, not the code, it survives regeneration. We instantiate this as a reference monitor for regenerated device drivers, and characterize the mediability envelope, six conditions on the effect vocabulary: legibility, spec-input observability, correlatability, completeness, outcome enumerability, and explicit durability. They decide when such mediation is possible.

cs.CR

Ion Track Formation via Electric-Field-Enhanced Energy Deposition

High-energy ion irradiation deposits extreme energy in a narrow range (1-10 nm) along ion trajectories in solid through electronic energy loss, producing unique irradiation effects such as ion tracks. However, intrinsic velocity effects impose an upper limit on electronic energy loss that cannot be overcome by adjusting irradiation parameters. We introduce a method using electric fields during irradiation to enhance nanoscale energy deposition by accelerating ion-excited electrons within sub-picosecond timescales.Our extended thermal spike model quantitatively describes this enhancement and predicts a significant reduction in the electronic energy loss required for ion track formation in amorphous SiO2, which is in excellent agreement with experimental observations. This work provides a new approach to control energy deposition during irradiation and boosts the wide application of ion tracks in material modification and nanoengineering to much broader extents.

physics.app-ph