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Jinyong Kim

Publications and source records attributed to Jinyong Kim.

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Engineering Spatial Dispersion to Synthesize Arbitrary Spatial Filters Based on Metagratings

This paper presents a design framework for synthesizing angularly selective spatial filters using non-uniform metagratings. While traditional metagratings focus on channeling energy into higher-order Floquet modes for a fixed incidence angle, we leverage the fundamental mode as a versatile degree of freedom to engineer spatial dispersion over a continuous angular spectrum. By strategically distributing non-uniformly loaded metallic wires and rigorously modeling their mutual interactions through an impedance-matrix formulation, we realize prescribed angular transfer functions with high efficiency. In particular, the framework is validated at 3.5 GHz through full-wave simulations of (i) low-pass, (ii) high-pass, and (iii) all-pass spatial filters. The results demonstrate that fundamental-mode engineering in non-uniform metagratins offers a highly efficient platform for advanced spatial wave manipulation.

physics.app-ph

Dual-wavelength Fourier Ptychographic Topography

We introduce a dual-wavelength Fourier ptychographic topography (FPT) method that extends the lambda/2 height-range limit of single-wavelength FPT. By reconstructing complex fields at two illumination wavelengths and exploiting their phase difference, the method achieves an effective synthetic wavelength lambda_s and an unambiguous range of lambda_s/2 without reducing lateral resolution. A noise-robust wrapped-number search is used to select per-pixel integer pairs (k1, k2), and a global refinement with circular TV regularization and soft bounds improves stability and preserves height discontinuities. The approach is validated through rigorous scattering-model-based simulations and experiments on structured silicon samples, demonstrating accurate height recovery in regimes where single-wavelength FPT exhibits phase wrapping. We analyze the limits of the FPT forward model and identify aspect ratio (AR) and phase modulation transfer function (ph-MTF) as key predictors of reconstruction fidelity. Simulations and experiments show that increasing AR beyond a practical threshold causes loss of high-frequency phase transfer and destabilizes dual-wavelength unwrapping. Within this AR range, dual-wavelength FPT provides robust, high-resolution topography suitable for semiconductor and industrial metrology.

physics.optics