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Joerg Henkel

Publications and source records attributed to Joerg Henkel.

5 recordsLinked to original sources

Retention-Aware RISC-V ISA Extension and Memory Controller on FPGA for MLC NVM

Non-volatile memory (NVM) technologies, particularly Multi-Level Cell (MLC) NVMs, offer significant potential for increasing memory density. MLC NVMs provide a tradeoff between write latency and retention time, where faster writes/stores result in lower retention and slower writes yield higher retention. However, limited work has been done to validate and prototype NVM-based systems in hardware, leveraging this tradeoff at the system level. In this paper, we present a novel memory controller architecture and a RISC-V instruction set extension to optimize MLC NVM write operations by balancing speed and retention time. Our custom NVM controller, built around a finite state machine with an AXI memory-mapped interface, efficiently manages read/write operations with enhanced burst transfers, minimizing latency. Additionally, we introduce a fast-store instruction in RISC-V to increasing write performance while addressing retention limitations. Further, we design a dedicated AXI slave peripheral that supports bit-significance-aware writes: critical bits (e.g., MSBs) are written using slower, high-retention writes, while non-critical bits (e.g., LSBs) use faster, low-retention writes to help enhance performance without compromising data reliability. These enhancements are implemented in hardware on an FPGA platform. Experimental results show that our controller reduces hardware overhead by 30% compared to conventional designs, and the fast-store instruction improves performance by over 7% for streaming workloads with less than 0.08% hardware overhead. The bit-wise AXI peripheral has a LUT utilization staying below 3.5% even for 64x64 matrices, and under 1% for 32x32 sizes, making it viable for integration into larger SoCs.

cs.AR

Approximate Decision Trees For Machine Learning Classification on Tiny Printed Circuits

Although Printed Electronics (PE) cannot compete with silicon-based systems in conventional evaluation metrics, e.g., integration density, area and performance, PE offers attractive properties such as on-demand ultra-low-cost fabrication, flexibility and non-toxicity. As a result, it targets application domains that are untouchable by lithography-based silicon electronics and thus have not yet seen much proliferation of computing. However, despite the attractive characteristics of PE, the large feature sizes in PE prohibit the realization of complex printed circuits, such as Machine Learning (ML) classifiers. In this work, we exploit the hardware-friendly nature of Decision Trees for machine learning classification and leverage the hardware-efficiency of the approximate design in order to generate approximate ML classifiers that are suitable for tiny, ultra-resource constrained, and battery-powered printed applications.

cs.AR

Automated Design Approximation to Overcome Circuit Aging

Transistor aging phenomena manifest themselves as degradations in the main electrical characteristics of transistors. Over time, they result in a significant increase of cell propagation delay, leading to errors due to timing violations, since the operating frequency becomes unsustainable as the circuit ages. Conventional techniques employ timing guardbands to mitigate aging-induced delay increase, which leads to considerable performance losses from the beginning of the circuit's lifetime. Leveraging the inherent error resilience of a vast number of application domains, approximate computing was recently introduced as an aging mitigation mechanism. In this work, we present the first automated framework for generating aging-aware approximate circuits. Our framework, by applying directed gate-level netlist approximation, induces a small functional error and recovers the delay degradation due to aging. As a result, our optimized circuits eliminate aging-induced timing errors. Experimental evaluation over a variety of arithmetic circuits and image processing benchmarks demonstrates that for an average error of merely $5\times10^{-3}$, our framework completely eliminates aging-induced timing guardbands. Compared to the respective baseline circuits without timing guardbands (i.e., iso-performance evaluation), the error of the circuits generated by our framework is $1208$x smaller.

cs.AR

Run-Time Accuracy Reconfigurable Stochastic Computing for Dynamic Reliability and Power Management

In this paper, we propose a novel accuracy-reconfigurable stochastic computing (ARSC) framework for dynamic reliability and power management. Different than the existing stochastic computing works, where the accuracy versus power/energy trade-off is carried out in the design time, the new ARSC design can change accuracy or bit-width of the data in the run-time so that it can accommodate the long-term aging effects by slowing the system clock frequency at the cost of accuracy while maintaining the throughput of the computing. We validate the ARSC concept on a discrete cosine transformation (DCT) and inverse DCT designs for image compressing/decompressing applications, which are implemented on Xilinx Spartan-6 family XC6SLX45 platform. Experimental results shows that the new design can easily mitigate the long-term aging induced effects by accuracy trade-off while maintaining the throughput of the whole computing process using simple frequency scaling. We further show that one-bit precision loss for input data, which translated to 3.44dB of the accuracy loss in term of Peak Signal to Noise Ratio for images, we can sufficiently compensate the NBTI induced aging effects in 10 years while maintaining the pre-aging computing throughput of 7.19 frames per second. At the same time, we can save 74\% power consumption by 10.67dB of accuracy loss. The proposed ARSC computing framework also allows much aggressive frequency scaling, which can lead to order of magnitude power savings compared to the traditional dynamic voltage and frequency scaling (DVFS) techniques.

cs.AR

Label-free electrical quantification of the dielectrophoretic response of DNA

A purely electrical sensing scheme is presented that determines the concentration of macromolecules in solution by measuring the capacitance between planar microelectrodes. Concentrations of DNA in the ng/mL range have been used in samples of 1 microL volume. The method has been applied to the characterisation of the dielectrophoretic response of DNA without the need for any chemical modifications. The influence of electrical parameters like duty cycle, voltage and frequency has been investigated. The results are in good agreement with data from dielectrophoretic studies on fluorescently labelled DNA. Extension of the method down to the single molecule level appears feasible.

physics.bio-ph