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John Mangum

Publications and source records attributed to John Mangum.

6 recordsLinked to original sources

Enhancing EBSD throughput of battery electrode materials using super-resolution generative adversarial networks

Quantitative microstructural characterization of Li-ion battery electrode materials using electron backscatter diffraction (EBSD) has been proven as a critical method for optimizing cell performance. However, the inherently slow nature of EBSD can hinder the throughput of analyses needed for statistical representation of a material microstructure being developed. This work demonstrates a machine learning super-resolution framework using a generative adversarial network (SRGAN) to significantly increase EBSD throughput. The SRGAN model was trained on EBSD data of LiNixMnyCozO2 (NMC) cathode particles to computationally enhance low-resolution datasets and its performance is compared against classical interpolation methods across various upscaling factors (2x to 12x). Both qualitative image metrics and quantitative microstructural analysis verified that the SRGAN systematically outperformed classical methods, particularly in preserving small grains and maintaining realistic grain boundaries. We demonstrate that a 5x upscaling factor, corresponding to a 25x speed-up in acquisition time or a 25x larger field of view, is practical while maintaining acceptable accuracy in key metrics like grain size and shape. For instance, at 5x upscaling, relative errors were +5.7%, +8.2%, and -14.6% on grain area-equivalent diameter, grain maximum sphere-inscribed diameter, and grain boundary length, respectively. The SRGAN methodology developed in this work significantly enhances the efficiency of EBSD acquisition for more statistically robust microstructural dataset, enabling EBSD as a high-throughput characterization tool for materials research and industrial process development.

cs.LG

Fast Homoepitaxy on (100) \b{eta}-Ga2O3 Substrates with Large Grown-In Offcut

The choice of crystalline orientation and offcut angle is non-trivial for low-symmetry $\beta\text{-Ga}_2\text{O}_3$, where anisotropy impacts bulk and thin film synthesis, material properties, and power device fabrication and performance. Scalable (100)-oriented $\beta\text{-Ga}_2\text{O}_3$ wafers are desirable for electronic devices but are not typically used due to 10-30x slower growth rates compared to other orientations. Here we report molecular beam epitaxy (MBE) growth rates equal to the fast growth direction by using (100) $Ga_2O_3$ wafers with large grown-in offcuts. The offcuts (up to 13.4{\deg}) are directly grown by Edge-defined Film-fed Growth (EFG) of 2D ribbons with rotated seed crystals, avoiding material loss from crystal boule offcut methods while maintaining high crystalline quality. Chemical-mechanical polishing produces epitaxy-ready substrates, and step flow growth is observed across all offcut angles. We measure an unintentional n-type doping density of $2{\times}10^{15} cm^{-3}$, one of the lowest values reported for MBE-grown films. Planar Schottky barrier diodes on these epilayers without edge termination have an on/off ratio ~10$^5$ and an average breakdown field of 1.56 MV/cm, comparable to or exceeding similar devices fabricated on other orientations. Overall, these results illustrate the importance of both crystal face and offcut angle and validate the use of the scalable (100)-oriented $\beta\text{-Ga}_2\text{O}_3$ wafers.

cond-mat.mtrl-sci

Low-Temperature Synthesis of Stable CaZn$_2$P$_2$ Zintl Phosphide Thin Films as Candidate Top Absorbers

The development of tandem photovoltaics and photoelectrochemical solar cells requires new absorber materials with band gaps in the range of ~1.5-2.3 eV, for use in the top cell paired with a narrower-gap bottom cell. An outstanding challenge is finding materials with suitable optoelectronic and defect properties, good operational stability, and synthesis conditions that preserve underlying device layers. This study demonstrates the Zintl phosphide compound CaZn$_2$P$_2$ as a compelling candidate semiconductor for these applications. We prepare phase pure, 500 nm-thick CaZn$_2$P$_2$ thin films using a scalable reactive sputter deposition process at growth temperatures as low as 100 °C, which is desirable for device integration. UV-vis spectroscopy shows that CaZn$_2$P$_2$ films exhibit an optical absorptivity of ~10$^4$ cm$^-$$^1$ at ~1.95 eV direct band gap. Room-temperature photoluminescence (PL) measurements show near-band-edge optical emission, and time-resolved microwave conductivity (TRMC) measurements indicate a photoexcited carrier lifetime of ~30 ns. CaZn$_2$P$_2$ is highly stable in both ambient conditions and moisture, as evidenced by PL and TRMC measurements. Experimental data are supported by first-principles calculations, which indicate the absence of low-formation-energy, deep intrinsic defects. Overall, our study should motivate future work integrating this potential top cell absorber material into tandem solar cells.

cond-mat.mtrl-sci

Ionic Bonds Control Ferroelectric Behavior in Wurtzite Nitrides

Ferroelectricity enables key integrated technologies from non-volatile memory to precision ultrasound. Wurtzite ferroelectric Al1-xScxN has recently attracted attention because of its robust ferroelectricity and Si process compatibility in addition to being the first known ferroelectric wurtzite. However, the origin and control of ferroelectricity in wurtzite materials is not yet fully understood. Here we show that the local bond ionicity, rather than simply the change in tetrahedral distortion, is key to controlling the macroscopic ferroelectric response, according to our coupled experimental and computational results. Across the composition gradient in Sc < 0.35 range and 140-260 nm thickness in combinatorial thin films of Al1-xScxN, the pure wurtzite phase exhibits a similar c/a ratio regardless of the Sc content, due to elastic interaction with neighboring crystals. The coercive field and spontaneous polarization significantly decrease with increasing Sc content despite this invariant c/a ratio, due to the more ionic bonding nature of Sc-N relative to the more covalent Al-N bonds, supported by DFT calculations. Based on these insights, ionicity engineering is introduced as an approach to reduce coercive field of Al1-xScxN for memory and other applications and to control ferroelectric properties in other wurtzites.

cond-mat.mtrl-sci

Ternary Nitride Semiconductors in the Rocksalt Crystal Structure

Inorganic nitrides with wurtzite crystal structures are well-known semiconductors used in optoelectronic devices. In contrast, rocksalt-based nitrides are known for their metallic and refractory properties. Breaking this dichotomy, here we report on ternary nitride semiconductors with rocksalt crystal structures, remarkable optoelectronic properties, and the general chemical formula Mg$_{x}$TM$_{1-x}$N (TM=Ti, Zr, Hf, Nb). These compounds form over a broad metal composition range and our experiments show that Mg-rich compositions are nondegenerate semiconductors with visible-range optical absorption onsets (1.8-2.1 eV). Lattice parameters are compatible with growth on a variety of substrates, and epitaxially grown MgZrN$_{2}$ exhibits remarkable electron mobilities approaching 100 cm$^{2}$V$^{-1}$s$^{-1}$. Ab initio calculations reveal that these compounds have disorder-tunable optical properties, large dielectric constants and low carrier effective masses that are insensitive to disorder. Overall, these experimental and theoretical results highlight Mg$_{G-3}$TMN$_{G-2}$ rocksalts as a new class of semiconductor materials with promising properties for optoelectronic applications.

cond-mat.mtrl-sci

Enhanced piezoelectric response of AlN via CrN alloying

Since AlN has emerged as an important piezoelectric material for a wide variety of applications, efforts have been made to increase its piezoelectric response via alloying with transition metals that can substitute for Al in the wurtzite lattice. Herein, we report density functional theory calculations of structure and properties of the Cr-AlN system for Cr concentrations ranging past the wurtzite-rocksalt transition point. By studying the different contributions to the longitudinal piezoelectric coefficient, we propose that the physical origin of the enhanced piezoelectricity in Cr$_x$Al$_{1-x}$N alloys is the increase of the internal parameter $u$ of the wurtzite structure upon substitution of Al with the larger Cr ions. Among a set of wurtzite-structured materials, we have found that Cr-AlN has the most sensitive piezoelectric coefficient with respect to alloying concentration. Based on these results, we propose that Cr-AlN is a viable piezoelectric material whose properties can be tuned via Cr composition; we support this proposal by combinatorial synthesis experiments, which show that Cr can be incorporated in the AlN lattice up to 30\% before a detectable transition to rocksalt occurs. At this Cr content, the piezoelectric modulus $d_{33}$ is approximately four times larger than that of pure AlN. This finding, combined with the relative ease of synthesis, may propel Cr-AlN as the prime piezoelectric material for applications such as resonators and acoustic wave generators.

cond-mat.mtrl-sci