John W. Freeland — Page 3

arXiv2010

A survey of fractured SrTiO$_3$ surfaces: from the micro-meter to nano-meter scale

Cross-sectional scanning tunneling microscopy was utilized to study fractured perovskie oxide surfaces. It was found for the non-cleavable perovskite oxide, SrTiO$_{3}$, that atomically flat terraces could be routinely created with a controlled fracturing procedure. Optical and scanning electron microscopy as well as a profilometer were used to obtain the information from sub-millimeter to sub-micrometer scales of the fractured surface topography.

cond-mat.mes-hall↗

arXiv2009

Nanometer-scale striped surface terminations on fractured SrTiO$_{3}$ surfaces

Using cross-sectional scanning tunneling microscopy on in situ fractured SrTiO$_{3}$, one of the most commonly used substrates for the growth of complex oxide thin films and superlattices, atomically smooth terraces have been observed on (001) surfaces. Furthermore, it was discovered that fracturing this material at room temperature results in the formation of stripe patterned domains having characteristic widths (~10 nm to ~20 nm) of alternating surface terminations that extend over a long-range. Spatial characterization utilizing spectroscopy techniques revealed a strong contrast in the electronic structure of the two domains. Combining these results with topographic data, we are able to assign both TiO$_{2}$ and SrO terminations to their respective domains. The results of this proof-of-principle experiment reveal that fracturing this material leads to reproducibly flat surfaces that can be characterized at the atomic-scale and suggests that this technique can be utilized for the study of technologically relevant complex oxide interfaces.

cond-mat.mes-hall↗