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Jonathan Plentz

Publications and source records attributed to Jonathan Plentz.

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Bottom-up Synthesis of Metastable 2D Hexagonal Copper(I) Iodide on Monolayer and within Bilayer Graphene

Copper(I) iodide (CuI) is a wide-bandgap semiconductor crystallizing in the 3D $\gamma$-phase under ambient conditions; its layered van der Waals bulk phase $\beta$-CuI is stable only between 643 and 673 K. The two-dimensional (2D) h-CuI form has been obtained via liquid-phase exfoliation of mechanochemically prepared precursors and via encapsulation between graphene sheets, whereas bottom-up growth of 2D h-CuI on open surfaces has not yet been demonstrated. Here, we report a vapor-phase synthesis of h-CuI directly on low-defect, large-area monolayer and within bilayer reduced oxo-graphene (r-oxo-G) at low temperatures. Using a copper TEM grid as the solid-state precursor for copper, HI-vapor exposure at 40 $\deg$C initiates nucleation, while annealing at 180 $\deg$C promotes the growth of extended h-CuI domains. Aberration-corrected HRTEM resolves the atomic structure, local twist angles, and lattice anisotropy of the CuI/r-oxo-G nanohybrid, while STEM-EDX yields a Cu:I ratio consistent with 1:1. First-principles calculations show that van der Waals adhesion to graphene stabilizes the supported hexagonal layer. Under the presented low-temperature precursor conditions, pathways for nucleation of the $\gamma$-phase are not available, allowing the hexagonal phase to form selectively at the graphene interface. Ab initio molecular dynamics simulations show that the heterostructure retains its hexagonal lattice order at 600 K, including on an open monolayer graphene support. The lateral extent of the growth is limited mainly by remaining interfacial adsorbates. These results establish a route to metastable 2D h-CuI on a chemically inert graphene template, which may be useful for wide-bandgap electronic and optoelectronic devices.

cond-mat.mtrl-sci

Soft X-ray imaging with coherence tomography in the water window spectral range using high-harmonic generation

High-harmonic generation (HHG) is used as a source for various imaging applications in the extreme ultraviolet spectral range. It offers spatially coherent radiation and unique elemental contrast with the potential for attosecond time resolution. The unfavorable efficiency scaling to higher photon energies prevented the imaging application in the soft X-ray range so far. In this work we demonstrate the feasibility of using harmonics for imaging in the water window spectral region (284$\,$eV to 532$\,$eV). We achieve nondestructive depth profile imaging in a heterostructure by utilizing a broadband and noise-resistant technique called soft X-ray Coherence Tomography (SXCT) at a high-flux lab-scale HHG source. SXCT is derived from Optical Coherence Tomography, a Fourier based technique, that can use the full bandwidth of the source to reach an axial resolution of 12$\,$nm in this demonstration. The employed source covers the entire water window, with a photon flux exceeding 10$^\text{6}\,$photons/eV/s at a photon energy of 500$\,$eV. We show local cross sections of a sample consisting of Aluminium oxide and Platinum layers of varying thickness on a Zinc oxide substrate. We validate the findings with scanning and transmission electron microscopy after preparation with focused ion beam milling.

physics.optics

Non-destructive depth reconstruction of Al-Al$_2$Cu layer structure with nanometer resolution using extreme ultraviolet coherence tomography

Non-destructive cross-sectional characterization of materials systems with a resolution in the nanometer range and the ability to allow for time-resolved in-situ studies is of great importance in material science. Here, we present such a measurements method, extreme ultraviolet coherence tomography (XCT). The method is non-destructive during sample preparation as well as during the measurement, which is distinguished by a negligible thermal load as compared to electron microscopy methods. Laser-generated radiation in the extreme ultraviolet (XUV) and soft x-ray range is used for characterization. The measurement principle is interferometric and the signal evaluation is performed via an iterative Fourier analysis. The method is demonstrated on the metallic material system Al-Al$_2$Cu and compared to electron and atomic force microscopy measurements. We also present advanced reconstruction methods for XCT which even allow for the determination of the roughness of outer and inner interfaces.

cond-mat.mtrl-sci