Joseph Orr | Searcharxiv

arXiv2021

OpenSync: An opensource platform for synchronizing multiple measures in neuroscience experiments

Background: The human mind is multimodal. Yet most behavioral studies rely on century-old measures such as task accuracy and latency. To create a better understanding of human behavior and brain functionality, we should introduce other measures and analyze behavior from various aspects. However, it is technically complex and costly to design and implement the experiments that record multiple measures. To address this issue, a platform that allows synchronizing multiple measures from human behavior is needed. Method: This paper introduces an opensource platform named OpenSync, which can be used to synchronize multiple measures in neuroscience experiments. This platform helps to automatically integrate, synchronize and record physiological measures (e.g., electroencephalogram (EEG), galvanic skin response (GSR), eye-tracking, body motion, etc.), user input response (e.g., from mouse, keyboard, joystick, etc.), and task-related information (stimulus markers). In this paper, we explain the structure and details of OpenSync, provide two case studies in PsychoPy and Unity. Comparison with existing tools: Unlike proprietary systems (e.g., iMotions), OpenSync is free and it can be used inside any opensource experiment design software (e.g., PsychoPy, OpenSesame, Unity, etc., https://pypi.org/project/OpenSync/ and https://github.com/moeinrazavi/OpenSync_Unity). Results: Our experimental results show that the OpenSync platform is able to synchronize multiple measures with microsecond resolution.

cs.LG↗

arXiv2021

Direct Opto-Electronic Imaging of 2D Semiconductor - 3D Metal Buried Interfaces

The semiconductor-metal junction is one of the most critical factors for high performance electronic devices. In two-dimensional (2D) semiconductor devices, minimizing the voltage drop at this junction is particularly challenging and important. Despite numerous studies concerning contact resistance in 2D semiconductors, the exact nature of the buried interface under a three-dimensional (3D) metal remains unclear. Herein, we report the direct measurement of electrical and optical responses of 2D semiconductor-metal buried interfaces using a recently developed metal-assisted transfer technique to expose the buried interface which is then directly investigated using scanning probe techniques. We characterize the spatially varying electronic and optical properties of this buried interface with < 20 nm resolution. To be specific, potential, conductance and photoluminescence at the buried metal/MoS$_2$ interface are correlated as a function of a variety of metal deposition conditions as well as the type of metal contacts. We observe that direct evaporation of Au on MoS$_2$ induces a large strain of ~5% in the MoS$_2$ which, coupled with charge transfer, leads to degenerate doping of the MoS$_2$ underneath the contact. These factors lead to improvement of contact resistance to record values of 138 kohm-um, as measured using local conductance probes. This approach was adopted to characterize MoS$_2$-In/Au alloy interfaces, demonstrating contact resistance as low as 63 kohm-um. Our results highlight that the MoS$_2$/Metal interface is sensitive to device fabrication methods, and provides a universal strategy to characterize buried contact interfaces involving 2D semiconductors.

cond-mat.mes-hall↗