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Josh Kacher

Publications and source records attributed to Josh Kacher.

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NLSTEM: Non-local denoising for enhanced 4D-STEM pattern indexing

4D-STEM-based orientation and phase mapping has enabled rapid microstructure quantification that can be directly combined with standard TEM- and STEM-based imaging modes. Typically, orientation mapping is coupled with beam precession (i.e. precession electron diffraction) to achieve high indexing rates, adding to the cost and often decreasing the spatial resolution of the approach. This paper introduces a new post processing approach modeled after the non-local pattern averaging and reindexing algorithm developed for the electron backscatter diffraction community, wherein post-collection, patterns are averaged using a distance similarity parameter. Results from Ni and Au thin films show that indexing rates can be significantly improved using this post-processing technique due to improved signal-to-noise ratios in the diffraction patterns. Interestingly, the highest indexing rates are achieved in samples heavily damaged via ion irradiation, suggesting that averaging over curved lattices further improves indexing rates.

cond-mat.mtrl-sci

Sub-nm2 ferroelectric domains via charged 180 degree walls in ZrO2

Flat phonon bands in fluorite ferroelectrics (HfO2 or ZrO2) shrink polar domains laterally to an irreducible half-unit-cell width (0.27 nm) within which the vertical arrangement of dipoles is expected to remain uniform. We report on the direct observation of nonuniform and nearly discrete vertical arrangements of dipoles in ZrO2 thin films consisting of closely spaced head-to-head (HH) and tail-to-tail (TT) charged 180 degree walls, each exhibiting a distinct bulk-like structure. These charged domain walls (CDWs) further compress the irreducibly narrow, laterally stacked domains vertically to a thickness of 1-2.75 nm, yielding in-plane domains with sub-nm2 footprints-among the smallest ever reported for any ferroelectric material. The HH and TT walls form due to their flat longitudinal optical (LO) polar bands and are electrostatically stabilized by bound-charge compensation via interstitial oxygen atoms, which act as natural structural defects at the HH walls. Moreover, these walls are predicted to be conducting and to exhibit ultralow propagation barriers, with HH walls (1.6 meV) being far more mobile than TT walls (22.3 meV), indicating strong potential for low-voltage, domain-wall-based nanoelectronics.

cond-mat.mtrl-sci

Discovering the nanoscale origins of localized corrosion in additive manufactured stainless steel 316L by in situ liquid cell TEM

Additive manufacturing (AM) by laser powder bed fusion (L-PBF) leads to the formation of a rich, hierarchical microstructure, including dislocation cell structures and elemental segregation. This structure has profound impacts on the corrosion behavior and mechanical properties of printed materials. In this study, we use in situ liquid cell scanning transmission electron microscope (STEM) to directly characterize the nanoscale origins of corrosion initiation in AM 316L stainless steel. Under applied anodic potentials, we found that the dislocation cellular boundaries were preferentially corroded and that pit-like features formed along the cellular boundaries. We directly observed the earliest stages of corrosion by controlling the biasing parameters to decelerate the corrosion processes. The results show that highly localized corrosion occurs via inclusion dissolution along dislocation cell boundaries. More widespread corrosion initiates at the dislocation cell boundaries and spreads throughout the dislocation networks.

cond-mat.mtrl-sci

Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy

Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Taking advantage of these advances in data collection rates requires the development and application of data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this paper, we highlight a few areas in materials science that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook on opportunities of integrating signal processing with automated TEM data analysis.

cs.CV

Antiferroelectric negative capacitance from a structural phase transition in zirconia

Crystalline materials with broken inversion symmetry can exhibit a spontaneous electric polarization, which originates from a microscopic electric dipole moment. Long-range polar or anti-polar order of such permanent dipoles gives rise to ferroelectricity or antiferroelectricity, respectively. However, the recently discovered antiferroelectrics of fluorite structure (HfO$_2$ and ZrO$_2$) are different: A non-polar phase transforms into a polar phase by spontaneous inversion symmetry breaking upon the application of an electric field. Here, we show that this structural transition in antiferroelectric ZrO$_2$ gives rise to a negative capacitance, which is promising for overcoming the fundamental limits of energy efficiency in electronics. Our findings provide insight into the thermodynamically 'forbidden' region of the antiferroelectric transition in ZrO$_2$ and extend the concept of negative capacitance beyond ferroelectricity. This shows that negative capacitance is a more general phenomenon than previously thought and can be expected in a much broader range of materials exhibiting structural phase transitions.

cond-mat.mtrl-sci