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Julianija Nikitina

Publications and source records attributed to Julianija Nikitina.

4 recordsLinked to original sources

Oxidation of Tantalum Nano-Film by Microwave Exposure

Oxidation and ablation of 200 nm tantalum films were carried out by three routes: (i) femtosecond (fs-)laser direct write, (ii) high-temperature annealing (HTA) in a tube furnace, and (iii) annealing in a 2.45 GHz microwave cavity. Complete conversion of the 200 nm Ta layer into 409 nm of Ta2O5 required one hour at 600 C in the furnace, but only minutes at ~ 50 W of microwave power. Fs-laser (515 nm/200 fs) oxidation of the Ta nano-film set in at an average single-pulse fluence of ~ 0.1 J/cm2 under strong pulse-to-pulse overlap (900 pulses per focal spot), i.e. within a narrow window bounded from above by the onset of ablation. Under microwave annealing, both the cavity resonance frequency and the quality factor Q changed markedly at the metal-to-oxide transition, reflecting the collapse of the real and imaginary parts of the permittivity at 2.45 GHz. This dielectric contrast turns the cavity into a sensor: the oxidation can be followed in real time from the shift of the cavity resonance, providing a non-invasive, in-situ diagnostic tool.

cond-mat.mtrl-sci↗

Understanding all-dielectric periodically modulated coatings for normal-incidence polarization control

An ultracompact thin-film polarizer for normal-incidence (0° angle of incidence, AOI) applications is analytically and experimentally investigated. The device is based on Fano resonances in periodically nanostructured dielectric thin films, enabling polarization selective reflection and transmission due to polarization dependent resonance frequencies. The operating principle is analyzed both analytically and numerically, and the optimized structure is fabricated and experimentally characterized. Measurements demonstrate polarization contrast ratios of up to approximately 1:1000 at normal incidence. Laser-induced damage threshold measurements using nanosecond laser pulses further confirm the high damage resistance of the all-dielectric polarizer.

physics.optics↗

Light Trapping by Non-Hermitian Thin Films

One of the exceptional features of non-Hermitian systems is the unidirectional wave interactions. Simultaneous modulation of the real and the imaginary part of the interaction potentials (of the refractive index and the gain/loss in the case of optical systems) can result in unequal coupling coefficients between the fields of different parts of the system. The unidirectional coupling can also be arranged not only between the internal fields of the system but also between internal fields and external radiation. At a particular (exceptional) point the situation can be achieved, that the external radiation is efficiently coupled into the system, but the internal radiation cannot escape backwards. In this way, the incident radiation can be trapped inside the non-Hermitian system and, eventually, can be efficiently absorbed there. We realize this idea in non-Hermitically modulated thin films. The modulation consists of a Hermitian part - the periodic corrugation of the surfaces of a thin film, and a non-Hermitian part - the modulation of losses along the film. We prove numerically and demonstrate experimentally that the incident radiation, coupled with such a non-Hermitian thin film, is unidirectionally trapped into a planar mode of the film, does not escape from the film (or escape weakly due to experimental imperfections), and is efficiently absorbed there.

physics.optics↗

Extremely Narrow, Sharp-Peaked Resonances at the Edge of the Continuum

We report a critical narrowing of resonances of a driven potential well, when their eigenfrequencies approach the edge of the continuum. The resonances also obtain unusual sharp-peak shapes at the continuum boundary. The situation can be realized for the electromagnetic wave propagating across the dielectric thin films with a periodically modulated interface(s). We show the general phenomenon semi-analytically on a simplified model of a driven quantum potential well, also by rigorous numerical analysis of Maxwell equations for the wave propagation across the thin film with a modulated interface(s). We justify the phenomenon experimentally, by the measurements of light reflection from the dielectric thin film deposited on a periodically modulated surface. The narrow and sharp-peak resonances can be used for an efficient narrow-band frequency- and spatial filtering of light.

physics.optics↗