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Justin L. Mallek

Publications and source records attributed to Justin L. Mallek.

7 recordsLinked to original sources

Elimination of Flux Trapping in Superconducting Circuits in Ambient Magnetic Fields

Superconductor digital electronics and quantum computing with superconducting qubits are promising next-generation computing technologies. When cooled down or operated in the presence of a nonzero background magnetic field $B_r$, superconducting thin films comprising the circuits can trap magnetic vortices that can degrade circuit or qubit performance. In this work, we report a practical solution for eliminating flux trapped during cooldown in ambient magnetic fields, $B_r\leq 60$ $\upmu$T, based on controlled local thermal gradients and moats, etched holes in the superconducting films of the circuit. Thermal gradients created by integrated on-chip resistive heaters move vortices towards the moats, where they become trapped away from circuitry regions and pinning sites. Using magnetic imaging and electrical circuit readout, we demonstrate that this approach is capable of removing magnetic flux trapped during field cooling and magnetic flux nucleated by circuit operation. If used in an environment with basic magnetic shielding, this solution is capable of suppressing all magnetic flux in a large-scale circuit, overcoming one of the long-standing challenges preventing high-performance scalable computing using superconductors.

cond-mat.supr-con↗

Mitigation of Magnetic Flux Trapping in Superconducting Electronics Using Moats

Magnetic flux (vortex) trapping remains a major obstacle to very large scale integration in superconducting electronics. Moats -- etched regions in circuit layers placed in ground planes and around critical circuitry -- offer a simple passive approach to sequester flux. Here, we systematically examine the effectiveness of moat arrays in superconducting niobium films as a function of geometry (size, shape, and density) and background magnetic field. By measuring the vortex expulsion field, we estimate the flux saturation number and flux trapping temperature for a range of geometries. We find that many moat designs effectively sequester flux in magnetically shielded environments (< 1 $μ$T), with high-aspect-ratio rectangular "slit" moats providing the strongest mitigation at minimal area cost. However, our measurements show that moats alone do not eliminate flux trapping in non-ideal films, as vortices can preferentially pin at material defects. These results provide design guidance for flux mitigation in superconducting integrated circuits and highlight the need for combined optimization of circuit geometries and materials.

cond-mat.supr-con↗

Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope

Magnetic flux trapping is a significant hurdle limiting the reliability and scalability of superconducting electronics, yet tools for imaging flux vortices remain slow or insensitive. We present a cryogenic widefield NV-diamond magnetic microscope capable of rapid, micrometer-scale imaging of flux trapping in superconducting devices. Using this technique, we measure vortex expulsion fields in Nb thin films and patterned strips, revealing a crossover in expulsion behavior between $10$ and $20~μ$m strip widths. The observed scaling agrees with theoretical models and suggests the influence of film defects on vortex expulsion dynamics. This instrument enables high-throughput magnetic characterization of superconducting materials and circuits, providing new insight for flux mitigation strategies in scalable superconducting electronics.

cond-mat.supr-con↗

Magnetic flux imaging in a 3D superconductor integrated circuit

We report on imaging magnetic flux distributions in a multilayered superconductor integrated circuit which emerge during magnetization and after field cooling of the circuit in the DC magnetic field. The obtained complicated field maps expose the flux propagation across the patterned superconducting ground planes sandwiching layers with Josephson junction-based logic cells, fine wire grid around the functional units, and multiple superconducting fill structures located in different inner layers. The observed intricate flux distributions are explained by specific patterns of Meissner screening currents and superconducting critical currents in different mutually interacting parts of the integrated circuit. Our results provide important insights into possible ways of improving the protection of superconductor integrated circuits from magnetic fields and their resilience against flux trapping.

physics.gen-ph↗

Machine Learning Enables Optimization of Diamond for Quantum Applications

Spins in solid-state materials, molecules, and other chemical systems have the potential to impact the fields of quantum sensing, communication, simulation, and computing. In particular, color centers in diamond, such as negatively charged nitrogen vacancy (NV$^-$) and silicon vacancy centers (SiV$^-$), are emerging as quantum platforms poised for transition to commercial devices. A key enabler stems from the semiconductor-like platform that can be tailored at the time of growth. The large growth parameter space makes it challenging to use intuition to optimize growth conditions for quantum performance. In this paper, we use supervised machine learning to train regression models using different synthesis parameters in over 100 quantum diamond samples. We train models to optimize NV$^-$ defects in diamond for high sensitivity magnetometry. Importantly, we utilize a magnetic-field sensitivity figure of merit (FOM) for NV magnetometry and use Bayesian optimization to identify critical growth parameters that lead to a 300% improvement over an average sample and a 55% improvement over the previous champion sample. Furthermore, using Shapley importance rankings, we gain new physical insights into the most impactful growth and post-processing parameters, namely electron irradiation dose, diamond seed depth relative to the plasma, seed miscut angle, and reactor nitrogen concentration. As various quantum devices can have significantly different material requirements, advanced growth techniques such as plasma-enhanced chemical vapor deposition (PE-CVD) can provide the ability to tailor material development specifically for quantum applications.

cond-mat.mtrl-sci↗

Progress toward superconductor electronics fabrication process with planarized NbN and NbN/Nb layers

To increase density of superconductor digital and neuromorphic circuits by 10x and reach integration scale of $10^8$ Josephson junctions (JJs) per chip, we developed a new fabrication process on 200-mm wafers, using self-shunted Nb/Al-AlOx/Nb JJs and kinetic inductors. The process has a layer of JJs, a layer of resistors, and 10 fully planarized superconducting layers: 8 Nb layers and 2 layers of high kinetic inductance materials, Mo$_2$N and NbN, with sheet inductance of 8 pH/sq and 3 pH/sq, respectively. NbN films were deposited by two methods: with $T_c$=15.5 K by reactive sputtering of a Nb target in Ar+N$_2$ mixture; with $T_c$ in the range from 9 K to 13 K by plasma-enhanced chemical vapor deposition (PECVD) using Tris(diethylamido)(tert-butylimido)niobium(V) metalorganic precursor. PECVD of NbN was investigated to obtain conformal deposition and filling narrow trenches and vias with high depth-to-width ratios, which was not possible to achieve using sputtering and other physical vapor deposition (PVD) methods at temperatures below $200 ^oC$ required to prevent degradation of Nb/Al-AlOx/Nb junctions. Nb layers with 200 nm thickness are used in the process layer stack as ground planes to maintain a high level of interlayer shielding and low intralayer mutual coupling, for passive transmission lines with wave impedances matching impedances of JJs, typically <=50 $Ω$, and for low-value inductors. NbN and NbN/Nb bilayer are used for cell inductors. Using NbN/Nb bilayers and individual pattering of both layers to form inductors allowed us to minimize parasitic kinetic inductance associated with interlayer vias and connections to JJs as well as to increase critical currents of the vias. Fabrication details and results of electrical characterization of NbN films, wires, and vias, and comparison with Nb properties are given.

cond-mat.supr-con↗

Fabrication of superconducting through-silicon vias

Increasing circuit complexity within quantum systems based on superconducting qubits necessitates high connectivity while retaining qubit coherence. Classical micro-electronic systems have addressed interconnect density challenges by using 3D integration with interposers containing through-silicon vias (TSVs), but extending these integration techniques to superconducting quantum systems is challenging. Here, we discuss our approach for realizing high-aspect-ratio superconducting TSVs\textemdash 10 $μ$m wide by 20 $μ$m long by 200 $μ$m deep\textemdash with densities of 100 electrically isolated TSVs per square millimeter. We characterize the DC and microwave performance of superconducting TSVs at cryogenic temperatures and demonstrate superconducting critical currents greater than 20 mA. These high-aspect-ratio, high critical current superconducting TSVs will enable high-density vertical signal routing within superconducting quantum processors.

quant-ph↗