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Kawsher Roxy

Publications and source records attributed to Kawsher Roxy.

3 recordsLinked to original sources

SwiftCTS: Fast Cross-Design Prediction and Pareto Optimization of Clock Tree Metrics via Few-Shot Calibration

Clock Tree Synthesis (CTS) is a computationally expensive stage in the physical design flow, requiring iterative EDA tool invocations to navigate a vast configuration space for optimal power, wirelength, and timing skew. Existing machine learning approaches require computationally expensive retraining or fine-tuning cycles to adapt to unseen macro architectures and are architecturally mismatched to the millions of evaluations demanded by exhaustive combinatorial search. We present SwiftCTS, a physics-informed surrogate framework that addresses both limitations simultaneously. By coupling lightweight, physics-grounded statistical features with gradient-boosted ensembles, SwiftCTS trains in under five seconds on a CPU and delivers sub-millisecond inference without GPU support. To handle out-of-distribution (OOD) designs without retraining or fine-tuning, we introduce a K-shot multiplicative calibration mechanism that anchors predictions to just one or two physical reference runs, reducing power prediction error from 24.5\% to 3.3\% and wirelength error from 56.6\% to under 1\% on unseen macros. Integrating this engine with an evolutionary optimizer, SwiftCTS evaluates 100,000 CTS configurations in under ten seconds, yielding Pareto-optimal frontiers that are physically validated within the OpenROAD flow. Closed-loop validation confirms prediction errors below 0.5\% for power and wirelength, and timing skew predictions within five picoseconds on an OOD benchmark, consistently outperforming default tool heuristics across all target metrics. Code publicly available at: \href{https://anonymous.4open.science/r/SwiftCTS-7E6E}{https://github.com/BarsatKhadka/SwiftCTS}

cs.LG

CTS-Bench: Benchmarking Graph Coarsening Trade-offs for GNNs in Clock Tree Synthesis

Graph Neural Networks (GNNs) are increasingly explored for physical design analysis in Electronic Design Automation, particularly for modeling Clock Tree Synthesis behavior such as clock skew and buffering complexity. However, practical deployment remains limited due to the prohibitive memory and runtime cost of operating on raw gate-level netlists. Graph coarsening is commonly used to improve scalability, yet its impact on CTS-critical learning objectives is not well characterized. This paper introduces CTS-Bench, a benchmark suite for systematically evaluating the trade-offs between graph coarsening, prediction accuracy, and computational efficiency in GNN-based CTS analysis. CTS-Bench consists of 4,860 converged physical design solutions spanning five architectures and provides paired raw gate-level and clustered graph representations derived from post-placement designs. Using clock skew prediction as a representative CTS task, we demonstrate a clear accuracy-efficiency trade-off. While graph coarsening reduces GPU memory usage by up to 17.2x and accelerates training by up to 3x, it also removes structural information essential for modeling clock distribution, frequently resulting in negative $R^2$ scores under zero-shot evaluation. Our findings indicate that generic graph clustering techniques can fundamentally compromise CTS learning objectives, even when global physical metrics remain unchanged. CTS-Bench enables principled evaluation of CTS-aware graph coarsening strategies, supports benchmarking of GNN architectures and accelerators under realistic physical design constraints, and provides a foundation for developing learning-assisted CTS analysis and optimization techniques.

cs.LG

Pinning Fault Mode Modeling for DWM Shifting

Extreme scaling for purposes of achieving higher density and lower energy continues to increase the probability of memory faults. For domain wall (DW) memories, misalignment faults arise when aligning domains with access points. A previously understudied type of shifting fault, a pinning fault may occur due to non-uniform pinning potential distribution caused by notches with fabrication imperfections. This non-uniformity can pin a wall during current-induced DW motion. This paper provides a model of geometric variations varying width, depth, and curvature variations of a notch, their impacts on the critical shift current, and a study of the resulting impact on fault rates of DW memory systems. An increase in the effective critical shift current due to 5% variation predicts a pinning fault rate on the order of $10^{-8}$ per shift, which results in a mean-time-to-failure of circa 2s for a DW memory system.

cs.ET