Complex Refractive Index Extraction for Spintronic Terahertz Emitter Analysis
Spintronic terahertz emitters (STEs) generate broadband terahertz (THz) radiation, which is essential for spectroscopy, imaging, and communication. The performances and the essential physical parameters of STE devices are linked to the dielectric properties of the constituent materials. Terahertz time-domain spectroscopy (THz-TDS) is an effective tool to measure these properties, but conventional analysis struggles with thin or complex multilayered systems due to simplifying approximations or complex transfer functions. In this work, we present a practical method to extract dielectric properties of STE multilayers using the Transfer Matrix Method (TMM). By comparing the THz pulse calculated using the Transfer Matrix Method (TMM) with the experimentally measured pulse transmitted through the sample, we can extract the dielectric properties of STEs, enhancing THz-TDS analysis and facilitating STE design and optimization. This method avoids constructing complex transfer functions, accommodates diverse sample geometries, and is designed to be accessible, with a publicly available codebase, making it a useful tool for STE research.