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Kritika Bhattacharya

Publications and source records attributed to Kritika Bhattacharya.

2 recordsLinked to original sources

Engineering 2D Van der Waals Electrode via MBE Grown Weyl Semimetal 1T-WTe2 for Enhanced Photodetection in InSe

Achieving low contact resistance in advanced quantum electronic devices remains a critical challenge. With the growing demand for faster and energy-efficient devices, 2D contact engineering offers a promising solution. Beyond graphene, 1T-WTe2 has attracted attention for its excellent electrical transport, quantum phenomena, and Weyl semimetallic properties. Here, we demonstrate the direct wafer-scale growth of 1T-WTe2 via molecular beam epitaxy (MBE) and its use as a 2D contact for layered materials such as InSe. The 1T WTe2/InSe interface exhibits a barrier height nearly half that of conventional metal contacts, and its contact resistance is reduced by a factor of 21, effectively suppressing Fermi level pinning and enabling efficient electron injection. InSe/1T WTe2 photodetectors show broad photoresponsivity (0.14 to 217.58 A/W) under NIR to DUV illumination with fast rise/fall times of 42/126 ms, compared to lower responsivity (0.000865 A/W to 3.64 A/W) and slower response (150/144 ms) for InSe/Ti Au devices. The 1T WTe2/InSe devices thus exhibit approximately 60 times higher responsivity and 4 times faster response than conventional metal contacts. These results establish MBE-grown 1T-WTe2 as an effective 2D electrode, enhancing photodetection performance while simplifying device architecture, making it a strong candidate for next generation nanoelectronic and optoelectronic devices.

physics.optics

Growth of Large Area WSe2 and Observation of Photogenerated Inversion Layer in DMOS Configuration

Here, we report the full-fledged journey towards the material synthesis and characterization of few-layered/thin WSe$_2$ using sputtered W-films on SiO$_2$/Si substrates followed by electrical studies under dark and illumination conditions. Growth temperature 500oC and gas pressure 55 sccm are found to be the optimized parameters for formation of thermodynamically stable WSe$_{2-x}$ with dominant Raman peak at 265 cm-1. XRD and HR-TEM measurement clarify the formation of high crystallinity along the c-axis and quasi-crystallinity along a and b axes respectively. Lower intensities from Raman-measurement and PL-peak at 768 nm (with 532 nm excitation wavelength) infers the thin nature of the grown film, along with strong second harmonic emission with excitation wavelength varying from 350nm to 450 nm. This work also retracks the controlled etching by reactive ions to achieve large area bi/tri-layer films to fabricate advanced devices. We also have fabricated an advanced MOS structure on SiO$_2$/p-Si substrate which shows tremendous performance by means of photo-capacitance under illumination condition where photo-carriers can survive the higher probe frequencies (> 1MHz). Under illumination condition, HfO$_2$/WSe$_2$ embedded MOS shows its dominance showing a huge electron-inversion region over HfO$_2$/ SiO$_2$/p-Si and SiO$_2$/p-Si MOS devices even at high frequencies (1-10 MHz). Thereby, this work also reveals a possible route for capacitance based highly sensitive photodetection using conventional Si-technology with integration of such WSe$_2$/W as an active material.

cond-mat.mtrl-sci