arXiv subjects

Lars Breuer

Publications and source records attributed to Lars Breuer.

4 recordsLinked to original sources

arXiv2025

Multi-field decomposed hyper-reduced order modeling of damage-plasticity simulations

This paper presents a multi-field decomposed approach for hyper-reduced order modeling to overcome the limitations of traditional model reduction techniques for gradient-extended damage-plasticity simulations. The discrete empirical interpolation method (DEIM) and the energy-conserving sampling and weighting method (ECSW) are extended to account for the multi-field nature of the problem. Both methods yield stable reduced order simulations, while significantly reducing the computational cost compared to full-order simulations. Two numerical examples are presented to demonstrate the performance and limitations of the proposed approaches. The decomposed ECSW method has overall higher accuracy and lower computational cost than the decomposed DEIM method.

cs.CE↗

arXiv2023

Non-equilibrium dynamics of electron emission from cold and hot graphene under proton irradiation

Characteristic properties of secondary electrons emitted from irradiated two-dimensional materials arise from multi-length and time-scale relaxation processes that connect the initial non-equilibrium excited electron distribution with their eventual emission. To understand these processes, which are critical for using secondary electrons as high-resolution thermalization probes, we combine first-principles real-time electron dynamics with modern experiments. Our data for cold and hot proton-irradiated graphene shows signatures of kinetic and potential emission and generally good agreement for electron yields between experiment and theory. The duration of the emission pulse is about 1.5 femtoseconds, indicating high time resolution when used as a probe. Our newly developed method to predict kinetic energy spectra shows good agreement with electron and ion irradiation experiments and prior models. We find that lattice temperature significantly increases secondary electron emission, whereas electron temperature has a negligible effect.

cond-mat.mtrl-sci↗

arXiv2022

Velocity distributions of particles sputtered from supported 2D-MoS$_2$ during highly charged ion irradiation

The interaction of highly charged ions (HCI) with solids leads to particle sputtering, which can be used for defect-mediated engineering of the properties of the material. Ions can store energy in the form of kinetic and potential energy (sum of the ionization energies) and transfer it to the solid upon impact. The interaction and sputtering mechanisms depend significantly on the projectile energies. However, the relevance of various interaction mechanisms is unknown. Here we show that for slow HCI (5 keV) the interaction mechanisms leading to particle emission by electronic excitation and transferred kinetic energy are independent from each other, which is consistent with our atomistic simulations. We have irradiated substrate supported (Au, SiO$_2$) monolayers of MoS$_2$ with highly charged xenon ions (charge state: 17$+$ - 40$+$), extracted the emitted neutral, post-ionized Mo particles into a time-of-flight mass spectrometer and determined their velocity distributions. We find two main contributions, one at high velocities and a second one at lower velocities, and assign them to kinetic and potential effects respectively. Our data suggests that the dominant mechanism for potential sputtering is related to electron-phonon coupling, while non-thermal processes play no significant role. We anticipate that our work will be a starting point for further experiments and simulations to determine whether the different processes resulting from E$_{pot}$ and E$_{kin}$ can be separated or whether synergistic effects play a role.

cond-mat.mtrl-sci↗

arXiv2015

SHIPS: A new setup for the investigation of swift heavy ion induced particle emission and surface modifications

The irradiation with fast ions with kinetic energies of > 10 MeV leads to the deposition of a high amount of energy along their trajectory (up to several ten keV/nm). The energy is mainly transferred to the electronic subsystem and induces different secondary processes of excitations which result in significant material modifications. A new setup to study these ion induced effects on surfaces will be described in this paper. The setup combines a variable irradiation chamber with different techniques of surface characterizations like scanning probe microscopy, time-of-flight secondary ion and neutral mass spectrometry, as well as low energy electron diffraction under ultra high vacuum conditions, and is mounted at a beamline of the universal linear accelerator (UNILAC) of the GSI facility in Darmstadt, Germany. Here, samples can be irradiated with high-energy ions with a total kinetic energy up to several GeVs under different angles of incidence. Our setup enables the preparation and in-situ analysis of different types of sample systems ranging from metals to insulators. Time-of-flight secondary ion mass spectrometry enables us to study the chemical composition of the surface, while scanning probe microscopy allows a detailed view into the local electrical and morphological conditions of the sample surface down to atomic scales. With the new setup particle emission during irradiation as well as persistent modifications of the surface after irradiation can thus be studied. We present first data obtained with the new setup, including a novel measuring protocol for time-of-flight mass spectrometry with the GSI UNILAC accelerator.

physics.ins-det↗