arXiv subjects

M Shafkat M Khan

Publications and source records attributed to M Shafkat M Khan.

4 recordsLinked to original sources

arXiv2026

Enhancing Co-packaging Optics Enabled Silicon Photonics Security Assurance Hardware Fingerprinting

Silicon photonics enables integration of optical components using standard semiconductor processes, greatly improving data communication bandwidth and energy efficiency. However, photonics integrated circuits (PICs) face unique security challenges, such as counterfeit or tampering threats, that conventional electronic security methods do not address. We propose a novel hardware fingerprinting technique that embeds two dimensional photonic crystal patterns into the density control filler regions of a PIC. Each PhC pattern is designed to resonate a specific visible to near infrared wavelengths, producing a distinctive optical signature (based on wavelength, polarization, and incident angle) for each device. Finite difference time domain (FDTD) simulation using ANSYS Lumerical is employed to optimize nanostructure dimensions and spacing so that each device's reflection/absorption spectrum contains unique narrowband peaks. No extra fabrication steps or materials are required beyond standard lithography, keeping costs low. The embedded nanostructures have sub-50nm precision, making forgery extremely difficult. Our method yields a high resolution, scalable fingerprint for silicon photonic chips, enabling cost-effective device authentication and improved supply chain security.

physics.optics↗

arXiv2026

AI-Driven Thermal Mapping and Management in 3D Integrated Photonic Circuits

Photonic Integrated Circuits (PICs) are advancing high-performance computing, data centers, and sensing, yet three-dimensional (3D) PICs introduce critical thermal management challenges due to high-density bonding and heterogeneous materials. Traditional methods like thermal microscopes and in-package sensors yield sparse data, limiting full thermal profile visibility. This paper presents a dual-method solution combining an AI-driven thermal modeling framework with a design-based heuristic approach. The AI method integrates sparse sensor data with design layer and density information to predict multilayer temperature variations, while the heuristic approach uses localized material properties, design layout, component geometries, and sensor coordinates to refine thermal estimations in specific regions. A 2D thermal map of a 3D PIC is generated by interpolating sensor data and adjusting for local thermal resistivity using comparative analysis between design regions. The heuristic method complements the AI model, improving estimation accuracy without extensive training data. Together, these methods offer a scalable, accurate solution for real-time thermal mapping and design-time simulation, enabling reliable thermal management in next-generation 3D photonic systems.

cs.AR↗

arXiv2026

Design Guidelines for In-line X-ray Inspection in Advanced Packaging Technology: A CoWoS Case Study

The shift towards advanced packaging technologies, including 2.5D and 3D integration, addresses the limitations of traditional methods while meeting increasing demands for performance, miniaturization, and efficiency. These methods enhance functionality and support heterogeneous integration but also introduce metrology challenges due to complex, three-dimensional structures. X-ray imaging, crucial for nondestructive inspection, faces compatibility issues such as material density similarities and noise scattering. To address these challenges, we propose a framework based on AI-integrated Design of Experiment (DoE) to develop design guidelines to optimize X-ray compatibility during the design stage. This framework, demonstrated through a case study on Chip-on-Wafer-on-Substrate (CoWoS) packaging, systematically analyzes design parameters and material properties to develop guidelines for improved inspection accuracy. Our method integrates AI to predict outcomes and optimize processes, ensuring high-quality X-ray images and enhancing defect detection. Implementing these guidelines can significantly improve inspection accuracy and reliability, reducing production costs and supporting the efficiency and scalability of advanced semiconductor technologies.

eess.IV↗

arXiv2023

US Microelectronics Packaging Ecosystem: Challenges and Opportunities

The semiconductor industry is experiencing a significant shift from traditional methods of shrinking devices and reducing costs. Chip designers actively seek new technological solutions to enhance cost-effectiveness while incorporating more features into the silicon footprint. One promising approach is Heterogeneous Integration (HI), which involves advanced packaging techniques to integrate independently designed and manufactured components using the most suitable process technology. However, adopting HI introduces design and security challenges. To enable HI, research and development of advanced packaging is crucial. The existing research raises the possible security threats in the advanced packaging supply chain, as most of the Outsourced Semiconductor Assembly and Test (OSAT) facilities/vendors are offshore. To deal with the increasing demand for semiconductors and to ensure a secure semiconductor supply chain, there are sizable efforts from the United States (US) government to bring semiconductor fabrication facilities onshore. However, the US-based advanced packaging capabilities must also be ramped up to fully realize the vision of establishing a secure, efficient, resilient semiconductor supply chain. Our effort was motivated to identify the possible bottlenecks and weak links in the advanced packaging supply chain based in the US.

eess.SY↗