arXiv subjects

M. Passaro

Publications and source records attributed to M. Passaro.

3 recordsLinked to original sources

arXiv2023

Coastal altimetry products in the strait of Gibraltar

This paper analyzes the availability and accuracy of coastal altimetry sea level products in the Strait of Gibraltar. All possible repeats of two sections of the Envisat and AltiKa ground-tracks were used in the eastern and western portions of the strait. For Envisat, along-track sea level anomalies (SLAs) at 18-Hz posting rate were computed using ranges from two sources, namely, the official SGDRs and the outputs of a coastal waveform retracker, the ALES retracker; in addition, SLAs at 1 Hz were obtained from CTOH, France. For AltiKa, along-track SLA at 40 Hz was also computed both from SGDR and ALES ranges. The quality of these altimeter products was validated using two tide gauges located on the southern coast of Spain. We observed an improvement of about 20% in the accuracy of the Envisat SLAs from ALES compared to the standard (SGDR) and the reprocessed CTOH data sets. AltiKa shows higher accuracy, with no significant differences between SGDR and ALES.

physics.ao-ph↗

arXiv2023

Wind-induced Cross-Strait Sea Level Variability in the Strait of Gibraltar using Coastal Altimetry and In-Situ Measurements

In this work, we retracked altimeter waveforms of ESA satellites. ERS2 RA and Envisat RA2 from descending track 0360 over the eastern side of the Strait of Gibraltar using the Adaptive Leading Edge Subwaveform ALES retracker.

physics.ao-ph↗

arXiv2015

In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory

Spatial and temporal variability of HfOx-based resistive random access memory (RRAM) are investigated for manufacturing and product designs. Manufacturing variability is characterized at different levels including lots, wafers, and chips. Bit-error-rate (BER) is proposed as a holistic parameter for the write cycle resistance statistics. Using the electrical in-line-test cycle data, a method is developed to derive BERs as functions of the design margin, to provide guidance for technology evaluation and product design. The proposed BER calculation can also be used in the off-line bench test and build-in-self-test (BIST) for adaptive error correction and for the other types of random access memories.

cs.ET↗