Absolute measurement of penetration depth of superconducting thin films using microwave stripline resonators
Superconducting microstrip resonators, which leverage kinetic inductance to probe electrodynamics, are sensitive tools for studying superconducting thin films at microwave frequencies. However, extracting the absolute superconducting penetration depth from these measurements remains challenging. In this work, we present a hybrid method to determine the absolute value of penetration depth over a wide temperature range by combining resonator measurements with finite-element electromagnetic simulations in COMSOL Multiphysics. We demonstrate this approach by extracting the penetration depth of NbN films by fabricating resonators from films of various thicknesses. Furthermore, we extend the technique to materials with lower critical temperatures by employing a flip-film geometry. By placing a sample above a NbN resonator, separated by a thin Mylar dielectric, we create a coupled structure where changes in the sample's penetration depth shift the resonant frequency. This non-destructive method provides a reliable, high-sensitivity platform for characterizing the penetration depth of diverse superconducting thin films.