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Marco Holzer

Publications and source records attributed to Marco Holzer.

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Glass fracture surface energy calculated from crystal structure and bond-energy data

We present a novel method to predict the fracture surface energy, {\gamma}, of isochemically crystallizing silicate glasses using readily available crystallographic structure data of their crystalline counterpart and tabled diatomic chemical bond energies, D0. The method assumes that {\gamma} equals the fracture surface energy of the most likely cleavage plane of the crystal. Calculated values were in excellent agreement with those calculated from glass density, network connectivity and D0 data in earlier work. This finding demonstrates a remarkable equivalence between crystal cleavage planes and glass fracture surfaces.

cond-mat.mtrl-sci

CMOS back-end-of-line compatible ferroelectric tunnel junction devices

Ferroelectric tunnel junction devices based on ferroelectric thin films of solid solutions of hafnium dioxide can enable CMOS integration of ultra-low power ferroelectric devices with potential for memory and emerging computing schemes such as in-memory computing and neuromorphic applications. In this work, we present ferroelectric tunnel junctions based on Hf$_{0.5}$Zr$_{0.5}$O$_{2}$ with materials and processes compatible with CMOS back-end-of-line integration. We show a device architecture based on W-Hf$_{0.5}$Zr$_{0.5}$O$_{2}$-Al$_{2}$O$_{3}$-TiN stacks featuring low temperature annealing at 400{\deg}C with performance comparable to those obtained with higher temperature annealing conditions.

physics.app-ph