arXiv subjects

Markus C. Knauer

Publications and source records attributed to Markus C. Knauer.

2 recordsLinked to original sources

arXiv2008

Microdeflectometry - a novel tool to acquire 3D microtopography with nanometer height resolution

We introduce "microdeflectometry", a novel technique for measuring the microtopography of specular surfaces. The primary data is the local slope of the surface under test. Measuring the slope instead of the height implies high information efficiency and extreme sensitivity to local shape irregularities. The lateral resolution can be better than one micron whereas the resulting height resolution is in the range of one nanometer. Microdeflectometry can be supplemented by methods to expand the depth of field, with the potential to provide quantitative 3D imaging with SEM-like features.

physics.optics↗

arXiv2007

Shape reconstruction from gradient data

We present a novel method for reconstructing the shape of an object from measured gradient data. A certain class of optical sensors does not measure the shape of an object, but its local slope. These sensors display several advantages, including high information efficiency, sensitivity, and robustness. For many applications, however, it is necessary to acquire the shape, which must be calculated from the slopes by numerical integration. Existing integration techniques show drawbacks that render them unusable in many cases. Our method is based on approximation employing radial basis functions. It can be applied to irregularly sampled, noisy, and incomplete data, and it reconstructs surfaces both locally and globally with high accuracy.

physics.optics↗