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Masayoshi Nagao

Publications and source records attributed to Masayoshi Nagao.

3 recordsLinked to original sources

Sensitivity Improvement by Sample Vibration Excitation in Resistivity Measurement for Non-Magnetic Material Using MFM

A novel approach for measuring the electrical resistivity of non-magnetic materials using magnetic force microscopy (MFM) is discussed. In this method, MFM detects magnetic fields generated by eddy currents induced by the oscillation of a magnetized probe tip. To enhance measurement sensitivity, it is essential to increase the magnitude of these eddy currents. It is discussed that introducing controlled sample vibration amplifies eddy current generation by increasing the relative velocity between the probe tip and the sample surface. Theoretical analysis predicts increase of the phase shift by sample vibration, and experimental validation using a modified MFM system confirms the improvement in sensitivity. The calculated and experimental results exhibit relatively good agreement, establishing that sample vibration excitation is an effective strategy for high-sensitivity resistivity measurements.

physics.app-ph

Monochromatic Electron Emission from Graphene-Insulator-Semiconductor-Structured Electron Source Utilizing Interference Efficets

The graphene-insulator-semiconductor-structured electron source has garnered significant attention due to its high electron emission efficiency and highly monochromatic electron emission. Graphene, with its c-axis orientation and well-defined interlayer spacing, exhibits electron interference effects that can influence the properties of emitted electrons. In this work, motion of an electron wave packet is numerically calculated to discuss the energy spread of the zero-order and first-order diffracted electron waves by mono- and multilayer graphene. It is found that the effects of multiple reflections of electron between the layers broaden the energy spread especially for the incident energy of 13.4 eV, and that highly monochromatic electron emission can be achieved by using diffracted electron wave with a small aperture.

physics.app-ph

Resistivity measurement for non-magnetic materials using high-order resonance mode of mfm-cantilever oscillation

A method to measure the electrical resistivity of materials using magnetic-force microscopy (MFM) is discussed, where MFM detects the magnetic field caused by the tip-oscillation-induced eddy current. To achieve high sensitivity, a high cantilever oscillation frequency is preferable, because it induces large eddy currents in the material. Higher-order resonance modes of the cantilever oscillation leads to higher frequency. To discuss such high-order-mode oscillation, a differential equation governing MFM cantilever oscillation in the high-order resonance mode is formulated, and an analytical solution of the phase difference is obtained. The result shows that the phase difference decreases at higher modes, because the effective spring constant increases faster than the force from the eddy current.

cond-mat.mtrl-sci