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Massimiliano Antonello

Publications and source records attributed to Massimiliano Antonello.

2 recordsLinked to original sources

Effect of increased DCR on the detection of minimum-ionizing particles with SiPMs

Radiation damage to a Silicon Photomultiplier (SiPM), as it occurs during the lifetime of the planned CMS high-granularity calorimeter detector, increases the dark current and degrades the signal-to-noise separation for minimum-ionizing particles (MIPs) and their detection efficiency. To investigate these effects, a plastic scintillator tile air-coupled to a SiPM is used to detect MIPs from a 90Sr source, in a single-channel design similar to the tiles of the CMS high-granularity calorimeter upgrade. We compared the SiPM responses after actual radiation exposure with responses simulated in the laboratory by increasing the dark-count rate (DCR) through optical illumination with an LED light source. This optical method induces no structural damage or deep defects, thus isolating the effect of increased dark-count rate. Our results show that both radiation-induced damage and LED-induced dark-count rate increases lead to similar reductions in the MIP signal and the signal-to-noise ratio. This indicates that the primary factor for the performance degradation is the elevated dark-count rate itself, rather than additional defects in the silicon. The results demonstrate that the key effects of radiation damage on SiPMs can be effectively replicated using controlled optical illumination, providing a practical and easily accessible approach for evaluating and optimizing SiPM performance under radiation-like conditions in the laboratory.

physics.ins-det↗

Study of depth-dependent charge collection profiles in irradiated pad diodes

In this work, charge collection profiles of non-irradiated and irradiated 150 $μ$m $p$-type pad diodes were measured using a 5.2 GeV electron beam traversing the diode parallel to the readout electrode. Four diodes were irradiated to 1 MeV neutron equivalent fluences of 2, 4, 8, and 12E15 {cm}^{-2} with 23 MeV protons. The Charge Collection Efficiency profiles as a function of depth are extracted by unfolding the data. The results of the measurements are compared to the simulation using three radiation damage models from literature which were tuned to different irradiation types and fluences.

physics.ins-det↗