SearcharxivSearch

arXiv subjects

Matthew A. Delaney

Publications and source records attributed to Matthew A. Delaney.

2 recordsLinked to original sources

Autonomous multi-ion optical clock with on-chip integrated photonic light delivery

Integrated photonics in trapped-ion systems are critical for the realization of applications such as portable optical atomic clocks and scalable quantum computers. However, system-level integration of all required functionalities remains a key challenge. In this work, we demonstrate an autonomously operating optical clock having a short-term frequency instability of $3.14(5)\times 10^{-14} / \sqrt{\tau}$ using an ensemble of four $^{171}\textrm{Yb}^{+}$ ions trapped in a multi-site surface-electrode trap at room temperature. All clock operations are performed with light delivered via on-chip waveguides. We showcase the system's resilience through sustained, autonomous operation featuring automated ion shuttling and reloading to mitigate ion loss during interleaved clock measurements. This work paves the way beyond component-level functionality to establish a viable and robust architecture for the next generation of portable, multi-ion quantum sensors and computers.

quant-ph

Fault Localization in a Microfabricated Surface Ion Trap using Diamond Nitrogen-Vacancy Center Magnetometry

As quantum computing hardware becomes more complex with ongoing design innovations and growing capabilities, the quantum computing community needs increasingly powerful techniques for fabrication failure root-cause analysis. This is especially true for trapped-ion quantum computing. As trapped-ion quantum computing aims to scale to thousands of ions, the electrode numbers are growing to several hundred with likely integrated-photonic components also adding to the electrical and fabrication complexity, making faults even harder to locate. In this work, we used a high-resolution quantum magnetic imaging technique, based on nitrogen-vacancy (NV) centers in diamond, to investigate short-circuit faults in an ion trap chip. We imaged currents from these short-circuit faults to ground and compared to intentionally-created faults, finding that the root-cause of the faults was failures in the on-chip trench capacitors. This work, where we exploited the performance advantages of a quantum magnetic sensing technique to troubleshoot a piece of quantum computing hardware, is a unique example of the evolving synergy between emerging quantum technologies to achieve capabilities that were previously inaccessible.

physics.ins-det