Matthieu Dufay | Searcharxiv

arXiv2007

On the role of step-flow advection during electromigration-induced step bunching

We propose a one-dimensional model based on the Burton-Cabrera-Frank equations to describe the electromigration-induced step bunching instability on vicinal surfaces. The step drift resulting from atomic evaporation and/or deposition is explicitly included in our model. A linear stability analysis reveals several stability inversions as the evaporation rate varies, while a deposition flux is shown to have a stabilizing effect.

cond-mat.mtrl-sci↗

arXiv2006

Electromigration-Induced Step Meandering on Vicinal Surfaces: Nonlinear Evolution Equation

We study the effect of a constant electrical field applied on vicinal surfaces such as the Si$(111)$ surface. An electrical field parallel to the steps induces a meandering instability with a nonzero phase shift. Using the Burton-Cabrera-Frank model, we extend the linear stability analysis performed by Liu, Weeks and Kandel (Phys. Rev. Lett. {\bf 81}, p.2743, 1998) to the nonlinear regime for which the meandering amplitude is large. We derive an amplitude equation for the step dynamics using a highly nonlinear expansion method. We investigate numerically two limiting regimes (small and large attachment lengths) which both reveal long-time coarsening dynamics.

cond-mat.mtrl-sci↗