arXiv subjects

Matthijn Dekkers

Publications and source records attributed to Matthijn Dekkers.

2 recordsLinked to original sources

arXiv2025

Correlation between structural and magnetic properties of epitaxial YIG films by pulsed laser deposition

In this study, we investigate the relationships between film growth conditions, crystalline microstructure, and magnetic properties of epitaxial Yttrium Iron Garnet (Y$_3$Fe$_5$O$_{12}$, YIG) thin films, deposited on Gallium Gadolinium Garnet (Ga$_3$Gd$_5$O$_{12}$, GGG). A direct correlation was observed between the residual epitaxial strain, bulk magnetic properties like saturation magnetization and magnetic damping), and the performance of spin-wave transmission devices based on these films. This correlation offers a pathway for a simplified, rapid assessment of YIG film quality, avoiding the need for complex time-consuming characterization techniques. In addition, we report a comprehensive investigation into the influence of pulsed-laser deposition parameters, including deposition temperature, pressure, laser fluence, frequency, and annealing conditions. Through systematic deposition optimization, state-of-the-art YIG films exhibiting ultralow magnetic damping could be obtained, which is critical for high-performance spintronic applications.

cond-mat.mtrl-sci↗

arXiv2023

Microwave Properties of Ba-Substituted Pb(Zr$_{0.52}$Ti$_{0.48}$)O$_3$ after Chemical-Mechanical Polishing

We have studied the effect of chemical-mechanical polishing (CMP) on the ferroelectric, piezoelectric, and microwave dielectric properties of Ba-substituted PZT (BPZT), deposited by pulsed laser deposition. CMP allowed for the reduction of the root mean square surface roughness of 600 nm thick BPZT films from 12.1nm to 0.79 nm. Ammonium peroxide (SC-1) cleaning was effective to remove Si CMP residuals. Measurements of the ferroelectric hysteresis after CMP indicated that the ferroelectric properties of BPZT were only weakly affected by CMP, while the piezoelectric d33 coefficient and the microwave permittivity were reduced slightly by 10%. This can be attributed to the formation of a thin dead layer at the BPZT surface. Moreover, the intrinsic dielectric permittivity at microwave frequencies between 1 and 25 GHz was not influenced by CMP, whereas the dead layer series capacitance decreased by 10%. The results indicate that the CMP process can be used to smoothen the BPZT surface without affecting the film properties strongly.

physics.app-ph↗