Md Sadib Rahman Ananta

arXiv2026

Efficient Patch-Based Anomaly Detection Fused with Diffusion Driven Generative Modeling for Semiconductor Wafer Bin Map Open Set Anomaly Detection

Spatial defect signatures on wafer bin maps (WBMs) trace yield loss to specific process faults, yet supervised classifiers recognize only the defect types seen during training, and one-class detectors built on a single mechanism tend to capture either local structural deviations or global distributional violations, but rarely both. This work proposes a hybrid one-class framework that couples a patch-based student-teacher detector (EfficientAD) with a denoising diffusion probabilistic model (DDPM) used for partial-diffusion reconstruction, and fuses their percentile-calibrated scores through a fixed convex combination. Trained on only 700 normal wafers from the WM-38K mixed-type dataset and evaluated on 18,658 held-out wafers, the fused detector reached an AUROC of 0.9985 and reduced misclassifications from 852 (DDPM) and 1,412 (EfficientAD) to 618, with all pairwise differences significant at p < 0.001. Beyond aggregate accuracy, the analysis shows that the gain arises from weakly overlapping errors between the two modules, yet fixed-weight fusion recovers only 40-70% of the correction available to an oracle selector. Under the benchmark's inverted class balance, average precision and F1 saturate, while the Matthews correlation coefficient and negative predictive value expose unreliable normal predictions. Pixel-level maps further show that strong image-level separability does not imply spatial localization, and the diffusion module succeeds as a local density prior rather than through global geometric reasoning. These findings motivate sample-adaptive fusion and imbalance-aware evaluation of hybrid wafer anomaly detectors.

cs.LG↗

arXiv2026

What the Sleeve Feels: Explainable Machine Learning for Textile Pressure-Based Postural Screening

Pressure-sensing smart textiles convert body-surface contact into a dense, image-like signal closely tied to posture and movement, making them a promising low-cost route to wearable posture screening. Realizing that promise, however, requires more than classification accuracy: a deployable system must generalize to wearers unseen during training, expose the physical evidence behind its decisions, and tolerate the small donning offsets that occur whenever a garment is removed and re-worn. This paper addresses these three requirements jointly using a knitted piezoresistive sleeve worn on the forearm as a testbed. We regroup fine-grained everyday activities into three coarser screening categories (neutral, potentially undesirable, and functional or transitional), engineer 29 interpretable pressure-distribution features spanning global intensity, spatial center of pressure, quadrant asymmetry, distribution complexity, and short-horizon temporal change, and evaluate under a strict subject-wise split. A tuned XGBoost classifier reaches 0.818 accuracy, 0.788 balanced accuracy, and 0.801 macro F1 on unseen test subjects, with tight frame-level bootstrap 95% intervals of about plus-minus 0.01 and a subject-to-subject standard deviation near 0.06 under leave-one-subject-out cross-validation. A simple 2D-CNN baseline trained on raw frames achieves broadly similar performance, showing that hand-engineered features are not left behind by a learned spatial representation on this task. SHAP-based explanation, a feature-group ablation, per-activity error analysis inside the pooled undesirable class, class-mapping sensitivity, and a simulated donning-rotation stress test together locate what the model relies on, where it degrades, and why, directly targeting the generalization, interpretability, and robustness gaps that determine whether such a system is deployable.

cs.AI↗