arXiv subjects

Menno J. Kappers

Publications and source records attributed to Menno J. Kappers.

10 recordsLinked to original sources

arXiv2026

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films

Porous gallium nitride (GaN) is a mesoporous crystalline material, typically in the form of a thin film on an unlike substrate, prepared by electrochemically etching conductive GaN. The use of porous GaN in electronics and optoelectronics is rapidly expanding, but is held back significantly by a lack of structural control and understanding of the principles of pore formation from underlying electrochemical mechanisms, where high-quality characterisation of pore morphology is essential to understanding these principles. Focused ion beam (FIB) tomography is an invaluable tool for such characterisation, but is hindered greatly by the pore back effect, where unwanted contrast appears in an image due to electrons scattering out from the back wall of a pore. No major attempts to formally quantify or assess the extent of the effect for different tomography experiments has been demonstrated. In this work, we demonstrate an advanced methodology for performing FIB tomography on porous GaN thin films, where the experiment is rotated to image pores perpendicular to the surface of the sample, and introduce new voxel intensity-based formalisms for assessing the impact of the pore back effect based on voxel intensities for individual features and the whole dataset. The new approach, which requires more complex preliminary setup, is found to significantly mitigate the pore back effect in porous GaN thin films with a range of pore morphologies without increasing the total experimental duration. The pore back effect can thus be quantified and mitigated in FIB tomography of porous GaN and similar mesoporous thin films.

cond-mat.mtrl-sci↗

arXiv2026

A stochastic simulation of the dislocation-mediated etching of porous GaN distributed Bragg reflectors

Distributed Bragg reflectors (DBRs) can be fabricated by electrochemically etching nitride epitaxial structures consisting of alternating layers of highly n-type doped and non-intentionally doped (NID) GaN. Threading dislocations (TDs) can be electrochemically etched into transport pipelines that can carry the etchant through the NID layers to access the doped material. Experimentally this has been shown to involve a mechanism where the etching pathway may follow one TD into a doped layer and then propagate sideways through the doped layer to continue via a different TD. Across multiple layers this process creates complex pore structures that have been described as 'cascades'. Here, we build a stochastic simulation for the DBR etching process that can reproduce some key features of the observed microstructures including the cascade morphology. By comparing the simulation output to samples etched at a range of voltages, we show that we can reproduce variations in experimental chronoamperometry data with applied bias by varying the probability of etching the doped layers within the simulation. The outputs of the resulting simulations replicate the experimentally observed cascade morphology. At higher voltages, experimental data reveal a lower proportion of cascade features, a trend that is also replicated by the simulations for relevant probability values. Outputs of the simulations also correlate well with experimental chronoamperometry data for samples where - unlike in a DBR - the thicknesses of the doped layers vary through the epitaxial multilayer, suggesting that the probabilistic simulation can be applied to a range of structures to help understand the dislocation-mediated electrochemical etching process.

cond-mat.mtrl-sci↗

arXiv2026

Controlled epitaxy of room-temperature quantum emitters in gallium nitride

The ability to generate quantum light at room temperature on a mature semiconductor platform opens up new possibilities for quantum technologies. Heteroepitaxial growth of gallium nitride on silicon substrates offers the opportunity to leverage existing expertise and wafer-scale manufacturing to integrate bright quantum emitters in this material within cavities, diodes, and photonic circuits. Until now, it has only been possible to grow GaN QEs at uncontrolled depths on sapphire substrates, which is disadvantageous for potential device architectures. Here, we report a method to produce GaN QEs by metal-organic vapor phase epitaxy at a controlled depth in the crystal through the application of silane treatment and subsequent growth of 3D islands. We demonstrate this process on highly technologically relevant silicon substrates, producing room-temperature QEs with a high Debye Waller factor and strongly anti-bunched emission.

cond-mat.mtrl-sci↗

arXiv2025

A cascade model for the defect-driven etching of porous GaN distributed Bragg reflectors

Fabrication of porous GaN distributed Bragg reflectors (DBRs) via the selective electrochemical etching (ECE) of conductive Si-doped layers, separated by non-intentionally doped (NID) layers, provides a straightforward methodology for producing highly reflective DBRs suitable for device overgrowth and integration, which has otherwise proven difficult in the III-nitride epitaxial system via conventional alloying. Such photonic materials can be fabricated by a lithography-free defect-driven etching process, where threading dislocations intrinsic to heteroepitaxy form nanoscale channels that facilitate etchant transport through NID layers. Here, we report the first three-dimensional characterisation of porous GaN-on-Si DBRs fabricated in this methodology with different ECE voltages, using serial-section tomography in a focused ion beam scanning electron microscope (FIB-SEM). These datasets reconstruct the pore morphology as etching proliferates through the alternating Si-doped/NID layer stack. Volumetric reconstruction enabled us to enhance the established `kebab' model for defect-driven etching by proposing a `cascade' model where etchant cascades through the material via vertical etching down nanopipes and horizontal etching across pores, forming complex networks directly related to the pathways taken. This accounts for premature nanopipe termination and discontinuities in nanopipe formation, where dislocations are observed to activate and deactivate individually. Statistical analysis of individual etching behaviour, across all dislocations for each tomograph, revealed a greater tendency to form continuous structures that follow conventional kebab behaviour at higher ECE voltages. We propose that higher ECE voltages alter the probability of dislocation etching relative to doped layer etching, thereby empowering morphological optimization through improved mechanistic understanding of ECE.

cond-mat.mtrl-sci↗

arXiv2023

Additive GaN solid immersion lenses for enhanced photon extraction efficiency from diamond color centers

Effective light extraction from optically active solid-state spin centres inside high-index semiconductor host crystals is an important factor in integrating these pseudo-atomic centres in wider quantum systems. Here we report increased fluorescent light collection efficiency from laser-written nitrogen vacancy centers (NV) in bulk diamond facilitated by micro-transfer printed GaN solid immersion lenses. Both laser-writing of NV centres and transfer printing of micro-lens structures are compatible with high spatial resolution, enabling deterministic fabrication routes towards future scalable systems development. The micro-lenses are integrated in a non-invasive manner, as they are added on top of the unstructured diamond surface and bond by Van-der-Waals forces. For emitters at 5 micrometer depth, we find approximately 2x improvement of fluorescent light collection using an air objective with a numerical aperture of NA = 0.95 in good agreement with simulations. Similarly, the solid immersion lenses strongly enhance light collection when using an objective with NA = 0.5, significantly improving the signal-to-noise ratio of the NV center emission while maintaining the NV's quantum properties after integration.

physics.optics↗

arXiv2020

Polar InGaN/GaN quantum wells: Revisiting the impact of carrier localization on the green gap problem

We present a detailed theoretical analysis of the electronic and optical properties of c-plane InGaN/GaN quantum well structures with In contents ranging from 5% to 25%. Special attention is paid to the relevance of alloy induced carrier localization effects to the green gap problem. Studying the localization length and electron-hole overlaps at low and elevated temperatures, we find alloy-induced localization effects are crucial for the accurate description of InGaN quantum wells across the range of In content studied. However, our calculations show very little change in the localization effects when moving from the blue to the green spectral regime; i.e. when the internal quantum efficiency and wall plug efficiencies reduce sharply, for instance, the in-plane carrier separation due to alloy induced localization effects change weakly. We conclude that other effects, such as increased defect densities, are more likely to be the main reason for the green gap problem. This conclusion is further supported by our finding that the electron localization length is large, when compared to that of the holes, and changes little in the In composition range of interest for the green gap problem. Thus electrons may become increasingly susceptible to an increased (point) defect density in green emitters and as a consequence the nonradiative recombination rate may increase.

cond-mat.mes-hall↗

arXiv2013

Non-polar (11-20) InGaN quantum dots with short exciton lifetimes grown by metal-organic vapor phase epitaxy

We report on the optical characterization of non-polar a-plane InGaN quantum dots (QDs) grown by metal-organic vapor phase epitaxy using a short nitrogen anneal treatment at the growth temperature. Spatial and spectral mapping of sub-surface QDs have been achieved by cathodoluminescence at 8 K. Microphotoluminescence studies of the QDs reveal resolution limited sharp peaks with typical linewidth of 1 meV at 4.2 K. Time-resolved photoluminescence studies suggest the excitons in these QDs have a typical lifetime of 538 ps, much shorter than that of the c-plane QDs, which is strong evidence of the significant suppression of the internal electric fields.

cond-mat.mtrl-sci↗

arXiv2012

Low threshold, room-temperature microdisk lasers in the blue spectral range

InGaN-based active layers within microcavity resonators offer the potential of low threshold lasers in the blue spectral range. Here we demonstrate optically pumped, room temperature lasing in high quality factor GaN microdisk cavities containing InGaN quantum dots (QDs) with thresholds as low as 0.28 mJ/cm2. This work, the first demonstration of lasing action from GaN microdisk cavities with QDs in the active layer, provides a critical step for the nitrides in realizing low threshold photonic devices with efficient coupling between QDs and an optical cavity.

cond-mat.mtrl-sci↗

arXiv2012

A full free spectral range tuning of p-i-n doped Gallium Nitride microdisk cavity

Effective, permanent tuning of the whispering gallery modes (WGMs) of p-i-n doped GaN microdisk cavity with embedded InGaN quantum dots over one free spectral range is successfully demonstrated by irradiating the microdisks with a ultraviolet laser (380nm) in DI water. For incident laser powers between 150 and 960 nW, the tuning rate varies linearly. Etching of the top surface of the cavity is proposed as the driving force for the observed shift in WGMs, and is supported by experiments. The tuning for GaN/InGaN microdisk cavities is an important step for deterministically realizing novel nanophotonic devices for studying cavity quantum electrodynamics.

physics.optics↗

arXiv2011

Controlled tuning of whispering gallery modes of GaN/InGaN microdisk cavities

Controlled tuning of the whispering gallery modes of GaN/InGaN μ-disk cavities is demonstrated. The whispering gallery mode (WGM) tuning is achieved at room temperature by immersing the μ-disks in water and irradiating with ultraviolet (UV) laser. The tuning rate can be controlled by varying the laser excitation power, with a nanometer precision accessible at low excitation power (~ several μW). The selective oxidation mechanism is proposed to explain the results and supported by theoretical analysis. The tuning of WGMs in GaN/InGaN μ-disk cavities may have important implication in cavity quantum electrodynamics and the development of efficient light emitting devices.

cond-mat.mtrl-sci↗