arXiv subjects

Michaela Červená

Publications and source records attributed to Michaela Červená.

2 recordsLinked to original sources

arXiv2026

Low-resistivity nitrogen-doped p-type Cu2O thin films enabled by millisecond flash lamp annealing

Flash lamp annealing (FLA) provides millisecond-scale thermal processing, but its effects on p-type Cu2O and nitrogen-related defects remain poorly understood. Reactively sputtered Cu2O:N films with different nitrogen content were deposited using reactive high-power impulse magnetron sputtering and exposed to a single 1.9 ms FLA pulse at 4.9 - 11.7 J cm-2. Their compositional,morphological, structural, vibrational, electrical, and optical responses were evaluated. WDS showed no statistically significant change in total elemental composition, and XRD confirmed retention of cubic Cu2O. Nitrogen-containing films exhibited surface coarsening, shifts of the Cu2O reflections, and non-monotonic changes in the Raman band assigned to molecular N2. Nitrogen incorporation substantially reduced the as-deposited resistivity. The very low value of 0.045 Ωcm was obtained after FLA at 4.9 J cm-2, whereas higher energy densities markedly increased resistivity. Hall measurements showed increasing mobility but decreasing hole concentration. At high energy densities, the optical band gap of nitrogen-rich films widened. The results define a narrow low-energy processing window with a positive effect on electrical properties, whereas high-energy FLA modifies the structure and optical absorption edge but degrades electrical conductivity.

cond-mat.mtrl-sci↗

arXiv2024

Extraordinary oxidation behavior of W-Zr thin-film metallic glasses: A route for tailoring functional properties of W-Zr-O films

The oxidation behavior of W-Zr thin-film metallic glasses (TFMGs) with 32, 48 and 61 at.% Zr, prepared by dc magnetron co-sputtering, was comprehensively studied after annealing in synthetic air. The study focuses on the effect of the annealing temperature (up to 600°C) on the oxidation process, oxygen saturation, structure evolution, and their subsequent impact on electrical, optical and mechanical properties. The findings reveal that controlled oxidation transforms W-Zr TFMGs into amorphous ceramic W-Zr-O films with substoichiometric compositions. This is a consequence of an oxidation process that does not proceed through the formation of a stoichiometric oxide layer on the surface of W-Zr TFMGs, acting as a diffusion barrier against fast oxidation, but leads to a gradual incorporation of oxygen across the film volume due to thermodynamics factors. Higher Zr content accelerates the oxygen incorporation and its depth uniformity in the films. As a result, the mechanical properties are significantly enhanced achieving hardness values of up to 17.5 GPa at approximately 50% oxygen saturation. Simultaneously, the electrical and optical properties are finely tuned with the resistivity and the extinction coefficient (measured at 550 nm) ranging from 1.7 to 95.7x10-4 Ohm.cm and 0.28 to 1.06, respectively.

cond-mat.mtrl-sci↗