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Michelle Povinelli

Publications and source records attributed to Michelle Povinelli.

2 recordsLinked to original sources

Uncooled low-noise thin-film optomechanical resonator for thermal sensing on lithium niobate

Optomechanical transduction harnesses the interaction between optical fields and mechanical motion to achieve sensitive measurement of weak mechanical quantities with inherently low noise. Lithium niobate combines low optical loss, strong piezoelectricity, high intrinsic fQ_m factor, and low thermal conductivity, making it promising for exploring optomechanical platforms targeting thermal sensing applications. Here, we developed an integrated optomechanical platform on thin-film lithium niobate with precisely engineered optical, mechanical, and thermal fields within a compact 40 {\mu}m by 40 {\mu}m footprint. The platform integrates suspended microring resonators with ultrathin central membranes, reducing mechanical stiffness and effective mass while maintaining a high optical factor Q_o of 1e6 and mechanical quality factor Q_m of 1117, which increases to 5.1e4 after oscillation. The design suppresses thermal dissipation into the silicon substrate and enhances thermal sensitivity, achieving a temperature coefficient of frequency of -124 ppm/K and a noise-equivalent power of 6.2 nW/sqrt(Hz) at 10 kHz at room temperature. This compact and scalable platform opens up new opportunities for high-sensitivity thermal sensing, supports heterogeneous integration with infrared absorbers for uncooled infrared detection, and enables fully integrated, all-optical on-chip readout, paving the way toward large-format, low-noise infrared sensing arrays.

physics.optics

Perfect Absorption at the Ultimate Thickness Limit in Planar Films

Reducing device volume is one of the key requirements for advanced nanophotonic technologies, however this demand is often at odds with designing highly absorbing elements which usually require sizeable thicknesses, such as for detector and sensor applications. Here we theoretically explore the thickness limitations of perfectly absorbing resonant systems and show surprisingly low bounds on minimal required thicknesses for total light absorption in thin planar films. We present a framework for understanding, predicting, and engineering topologically protected perfect absorption in a wide range of resonantly absorbing materials. The proposed analytical approach leads to a simple relation between a perfect absorbers thickness and dielectric function loss, which also serves as a guide for determining the absorption potential of existing and emerging materials at the ultimate thickness limit. The presented results offer new insights into the extremes of light-matter interaction and can facilitate the design of ultra-sensitive light absorbers for detector and sensor systems.

physics.optics