Radial Fast Entangling Gates Under Micromotion in Trapped-Ion Quantum Computers
Micromotion in radio-frequency ion traps is generally considered detrimental for quantum logic gates, and is typically minimized in state-of-the-art experiments. However, as a deterministic effect, it can be incorporated into quantum control frameworks aimed at designing high-fidelity quantum logic controls. In this work, we demonstrate that micromotion can be beneficial to the design of fast gates utilizing the radial modes of a two-ion crystal, particularly in the sub-trap-period regime where high-fidelity control sequences are identified with operation times ranging from hundreds of nanoseconds to microseconds. Through analysis of select fast gate solutions, we uncover the physical origin of micromotion enhancement and further study the induced gate error under experimental noises and control imperfections. This analysis establishes the feasibility of realising high-fidelity entangling gates in hundreds of nanoseconds using the micromotion-sensitive radial modes of trapped-ion crystals.