arXiv subjects

Mor M. Dahan

Publications and source records attributed to Mor M. Dahan.

2 recordsLinked to original sources

arXiv2026

A Reconfigurable Time-Domain In-Memory Computing Macro using FeFET-Based CAM with Multilevel Delay Calibration in 28 nm CMOS

Time-domain nonvolatile in-memory computing (TD-nvIMC) offers a promising pathway to reduce data movement and improve energy efficiency by encoding computation in delay rather than voltage or current. This work presents a fully integrated and reconfigurable TD-nvIMC macro, fabricated in 28 nm CMOS, that combines a ferroelectric FET (FeFET)-based content-addressable memory array, a cascaded delay element chain, and a time-to-digital converter. The architecture supports binary multiply-and-accumulate (MAC) operations using XOR- and AND-based matching, as well as in-memory Boolean logic and arithmetic functions. Sub-nanosecond MAC resolution is achieved through experimentally demonstrated 550 ps delay steps, representing a 2000$\times$ improvement over prior FeFET TD-nvIMC work, enabled by multilevel-state calibration with $\leq$ 100 ps resolution. Write-disturb resilience is ensured via isolated triple-well bulks. The proposed macro achieves a measured throughput of 222.2 MOPS/cell and energy efficiency of 1887 TOPS/W at 0.85 V, establishing a viable path toward scalable, energy-efficient TD-nvIMC accelerators.

cs.ET↗

arXiv2022

C-AND: Mixed Writing Scheme for Disturb Reduction in 1T Ferroelectric FET Memory

Ferroelectric field effect transistor (FeFET) memory has shown the potential to meet the requirements of the growing need for fast, dense, low-power, and non-volatile memories. In this paper, we propose a memory architecture named crossed-AND (C-AND), in which each storage cell consists of a single ferroelectric transistor. The write operation is performed using different write schemes and different absolute voltages, to account for the asymmetric switching voltages of the FeFET. It enables writing an entire wordline in two consecutive cycles and prevents current and power through the channel of the transistor. During the read operation, the current and power are mostly sensed at a single selected device in each column. The read scheme additionally enables reading an entire word without read errors, even along long bitlines. Our Simulations demonstrate that, in comparison to the previously proposed AND architecture, the C-AND architecture diminishes read errors, reduces write disturbs, enables the usage of longer bitlines, and saves up to 2.92X in memory cell area.

eess.SY↗