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Moritz Frey

Publications and source records attributed to Moritz Frey.

3 recordsLinked to original sources

Experimental and Numerical Study of the Transient Response of a Cantilever Beam with a Piezoelectric Disc Sensor

Online and real-time sensing and monitoring of the health state of complex structures, such as aircraft and critical components of power stations, are essential aspects of research in dynamics. Several types of sensors are used to capture dynamic responses and monitor changes during the operation of critical parts of complex systems. Piezoelectric (PZ) materials belong to a class of electroactive materials that convert mechanical deformation into an electrical response. For example, PZ ceramics or PVDF foils are employed for online sensing of the time history of mechanical deformation. This paper focuses on the dynamical response of a cantilever beam structure equipped with a glued PZ sensor and combines experimental and modelling approaches to achieve accurate and reliable results. The time history of the normal velocity at a point on the beam surface was recorded with a laser vibrometer during transient vibrations of the beam, triggered by the sudden removal of a mass load at the beam's free end. Simultaneously, the output voltage of the PZ sensor was measured with an electronic device. An elastodynamic model of a cantilever beam coupled with a piezoelectric sensor is introduced, along with its discretization using the finite element method. The mathematical model includes additional terms that enforce a floating-potential boundary condition to maintain a constant charge on one of the sensor's electrodes and is presented in an extended form suitable for sensitivity analysis or parameter identification. The model implementation is validated using a numerical example corresponding to the experimental setup. The computed results show good agreement with the experimental data. Furthermore, values of the Rayleigh damping parameters were identified based on the experimental measurements.

cs.CE

Current Noise in Tunnel Junctions

We study current fluctuations in tunnel junctions driven by a voltage source. The voltage is applied to the tunneling element via an impedance providing an electromagnetic environment of the junction. We use circuit theory to relate the fluctuations of the current flowing in the leads of the junction with the voltage fluctuations generated by the environmental impedance and the fluctuations of the tunneling current. The spectrum of current fluctuations is found to consist of three parts: a term arising from the environmental Johnson-Nyquist noise, a term due to the shot noise of the tunneling current and a third term describing the cross-correlation between these two noise sources. Our phenomenological theory reproduces previous results based on the Hamiltonian model for the dynamical Coulomb blockade and provides a simple understanding of the current fluctuation spectrum in terms of circuit theory and properties of the average current. Specific results are given for a tunnel junction driven through a resonator.

cond-mat.mes-hall

Effect of the electromagnetic environment on current fluctuations in driven tunnel junctions

We examine current fluctuations in tunnel junctions driven by a superposition of a constant and a sinusoidal voltage source. In standard setups the external voltage is applied to the tunneling element via an impedance providing an electromagnetic environment of the junction. The modes of this environment are excited by the time-dependent voltage and are the source of Johnson-Nyquist noise. We determine the autocorrelation function of the current flowing in the leads of the junction in the weak tunneling limit up to terms of second order in the tunneling Hamiltonian. The driven modes of the electromagnetic environment are treated exactly by means of a unitary transformation introduced recently. Particular emphasis is placed on the spectral function of the current fluctuations. The spectrum is found to comprise three contributions: a term arising from the Johnson-Nyquist noise of the environmental impedance, a part due to the shot noise of the tunneling element and a third contribution which comes from the cross-correlation between fluctuations caused by the electromagnetic environment and fluctuations of the tunneling current. All three parts of the spectral function occur already for devices under dc bias. The spectral function of ac driven tunneling elements can be determined from the result for a dc bias by means of a photo-assisted tunneling relation of the Tien-Gordon type. Specific results are given for an Ohmic environment and for a junction driven through a resonator.

cond-mat.mes-hall