Muhammad Nadzir Marsono

arXiv2026

Systematic Literature Review of Machine Learning Models and Applications for Text Recognition

Optical Character Recognition (OCR) for text recognition using machine vision has significantly improved, particularly when handling heterogeneous textual data. Traditional OCR models struggle with script variations, writing styles, and degraded documents. Advancements in technology are leading to new AI models with improved architecture for handling multiple languages and complex data formats. Despite this progress, a comprehensive evaluation of OCR advancements remains limited. Based on the established preferred reporting items for systematic reviews and meta-analysis (PRISMA) guidelines, this literature review presents an extensive assessment of OCR research to trace the evolution of AI models over the past decade. It explores the transition in AI models, application domains, data types, linguistic coverage, and challenges. Through a detailed analysis of 97 selected studies published during January 2015 - January 2025, key OCR models are identified, and their performance, strengths, and limitations are analyzed. The findings highlight how OCR technologies have evolved to address structured and unstructured text, scene text recognition, and multilingual processing. Unresolved challenges include limited resources for underrepresented languages, high variability in handwritten text, visual similarity among characters, and constraints in real-time OCR applications. To address these issues, several promising approaches are proposed. Key suggestions include self-supervised learning, multimodal AI, automated machine learning (AutoML), AI-assisted postprocessing, tiny machine learning (TinyML), and the creation of joint corpora for script matching. The future recommendations aim to enhance OCR accuracy and tackle the challenges identified for real-time industrial applications. This study will guide future research and establish a foundation for OCR field.

cs.CV↗

arXiv2026

Automated Estimation of MBIST Area and Test Time in Heterogeneous Memory IPs via Stacked Ensemble Framework

Embedded memories occupy a large portion of modern System-on-Chip (SoC) designs, especially in high-performance applications such as artificial intelligence and edge computing. Memory Built-In Self-Test (MBIST) is commonly used to ensure memory reliability, but it introduces additional area and test time overhead. Accurate early estimation of these overheads is important during design planning, yet conventional methods rely on full Register Transfer Level (RTL) synthesis and test pattern generation, which are slow and resource-intensive. This study proposes a supervised learning framework that predicts MBIST area and test time directly from RTL-level design parameters without synthesis. A dataset of 4,470 samples for area and 624 for test time was generated using Synopsys Design Compiler and MINT, an Intel-enhanced MBIST tool. Input features include memory count, word width, address depth, port configuration, and clock domains. For area prediction, the features are processed through polynomial expansion, log transformation, and scaling, followed by a stacked ensemble model using XGBoost, LightGBM, and a Neural Network with Gradient Boosting as the meta-learner. For test time, XGBoost and LightGBM are combined using Ridge Regression, with hyperparameters tuned through a 100-trial Optuna search. The models achieved 90.68% accuracy for area and 96.80% for test time within a +/-10% margin, improving over baseline methods by 8.53% and 48.80% respectively. The results show that this approach enables faster estimation of MBIST costs and supports more efficient design decisions in memory IP development.

cs.AR↗