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Nader H. Bshouty

Publications and source records attributed to Nader H. Bshouty.

At least 19 recordsLinked to original sources

A Tight Scale-Locality Bound for Partial Detection in Non-Adaptive Group Testing

We give a lower bound for randomized non-adaptive group testing when the goal is to find any $\ell$ defective items but the total number $d$ of defectives is unknown. Bshouty and Haddad-Zaknoon proved an upper bound of $O(\ell\log^2 n)$ tests and a lower bound of $$Ω\!\left(\frac{\ell\log^2 n}{\log \ell+\log\log n}\right).$$ We prove the matching lower bound. More generally, we show that every randomized non-adaptive algorithm that succeeds with constant probability for every defective set must use $$Ω\!\left(\ell\log^2(n/\ell)\right)$$ tests. The proof is as follows. At a fixed value of $d$, finding $\ell$ defectives requires about $\ell\log(n/d)$ bits of information. On the other hand, one fixed group test is informative only when its size is tuned to the scale of $d$; across all logarithmic scales of $d$, a single test contributes only $O(1)$ bits. Summing over all scales gives the lower bound. We also record the matching upper bound $$O\!\left(\ell\log^2(n/\ell)\right),$$ obtained by running the known-$d$ algorithm in parallel over dyadic guesses for $d$. Thus the randomized non-adaptive complexity of unknown-$d$ partial detection is $Θ\!\left(\ell\log^2(n/\ell)\right)$ for constant success probability.

cs.DS↗

Sublinear Time Algorithms for Abelian Group Property Testing

In this paper, we study the problems of abelian group property testing in two models. In the partially specified model (PS-model), the algorithm does not know the group size but can access randomly chosen elements of the group, along with the Cayley table of these elements, which provides the result of the binary operation for every pair of selected elements. In the stronger fully specified model (FS-model), the algorithm knows the size of the group and has access to all its elements and the Cayley table. In property testing of abelian group property, given a finite set $G$ and oracle access to a binary operation $*:G^2\to G$, we aim to distinguish whether $(G,*)$ is an abelian group or is $ε$-far from any abelian group over $G$. Using a novel approach, we present a tester in the PS-model (and consequently in the FS-model) that runs in time $\tilde O(\sqrt{|G|}+1/ε)$, improving upon the Goldreich-Tauber tester, which runs in time $O(|G|/ε)$. Additionally, our tester improves another tester by Goldreich and Tauber that runs in time $O(|G|^2)$ and makes $\tilde O(|G|+1/ε)$ queries. We further extend our result to testing subclasses of abelian groups ${\cal G}$ that are closed under isomorphism. Specifically, if one can decide in time $T$ whether an abelian group of the form $Z_{m_1}\times \cdots\times Z_{m_r}$ belongs to ${\cal G}$, then there exists a tester for ${\cal G}$ that runs in time $T+\tilde O(\sqrt{|G|}+1/ε)$ and makes $O(\sqrt{|G|}+1/ε)$ queries. This result gives testers that run in time $O(\sqrt{|G|}+1/ε)$ for subclasses such as abelian groups of rank at most $k$, abelian $p$-groups, and vector spaces over~$Z_p$.

cs.DS↗

A Note on Second-Order Expected Maximum-Load Bounds for Binary Linear Hashing

Let $S\subseteq F_2^u$ have size $n=2^\ell$, and let $h:F_2^u\to F_2^\ell$ be a uniformly random linear map. For $y\in F_2^\ell$, write $Load_h(y):=|h^{-1}(y)\cap S|$, and let $M(S,h):=\max_{y\in F_2^\ell} Load_h(y)$ be the maximum load. Jaber, Kumar and Zuckerman (STOC 2025) proved that the expected maximum load of $h$ on $S$ is at most $16\log n/\log\log n$, matching the fully independent keys-into-bins scale up to constants. Their proof also gives the tail estimate \[ \Pr\left[ M(S,h)\ge R\frac{\log n}{\log\log n} \right] \le O\left(\frac{1}{R^{2}}\right). \] We record a base optimization in their exponential-potential method showing that binary linear hashing nearly matches fully independent hashing also at the level of the second-order maximum-load scale. For every $R>1$ satisfying $R\ell^{1-1/R}\ge D\ln\ell$, where $D$ is an absolute constant, we prove \[ \Pr\left[ M(S,h)\ge R\frac{\log n}{\log\log n} \right] \le O\left( \frac{(\log\log n)^2}{R^2(\log n)^{2-2/R}} \right). \] Integrating this tail yields \[ E[M(S,h)] \le \left( 1+ (1+o(1)) \frac{\log\log\log n}{\log\log n} \right) \frac{\log n}{\log\log n}. \] Thus binary linear hashing matches fully independent hashing in the leading term and matches the dominant second-order correction up to a $1+o(1)$ factor. We also prove, by an independent self-contained argument, a sharp tail bound for one prescribed bucket: for fixed $y\in F_2^\ell$, \[ \Pr[ Load_h(y)>2^a-2]\le γ^{-1}2^{-a^2}, \] where $ γ=\prod_{j\ge1}(1-2^{-j}) $. A subspace construction shows that this is asymptotically tight even in the leading constant as $ a\to\infty $. However, this controls only a fixed bucket; a direct union bound over all buckets loses a factor $ 2^\ell $.

cs.DS↗

Classes Testable with $O(1/ε)$ Queries for Small $ε$ Independent of the Number of Variables

In this paper, we study classes of Boolean functions that are testable with $O(ψ+1/ε)$ queries, where $ψ$ depends on the parameters of the class (e.g., the number of terms, the number of relevant variables, etc.) but not on the total number of variables $n$. In particular, when $ε\le 1/ψ$, the query complexity is $O(1/ε)$, matching the known tight bound $Ω(1/ε)$. This result was previously known for classes of terms of size at most $k$ and exclusive OR functions of at most $k$ variables. In this paper, we extend this list to include the classes: $k$-junta, functions with Fourier degree at most $d$, $s$-sparse polynomials of degree at most $d$, and $s$-sparse polynomials. Additionally, we show that for any class $C$ of Boolean functions that depend on at most $k$ variables, if $C$ is properly exactly learnable, then it is testable with $O(1/ε)$ queries for $ε<1/ψ$, where $ψ$ depends on $k$ and independent of the total number of variables $n$.

cs.DS↗

Sublinear Time Algorithms for Abelian Group Isomorphism and Basis Construction

In this paper, we study the problems of abelian group isomorphism and basis construction in two models. In the {\it partially specified model} (PS-model), the algorithm does not know the group size but can access randomly chosen elements of the group along with the Cayley table of those elements, which provides the result of the binary operation for every pair of selected elements. In the stronger {\it fully specified model} (FS-model), the algorithm knows the size of the group and has access to its elements and Cayley table. Given two abelian groups, $G$, and $H$, we present an algorithm in the PS-model (and hence in the FS-model) that runs in time $\tilde O(\sqrt{|G|})$ and decides if they are isomorphic. This improves on Kavitha's linear-time algorithm and gives the first sublinear-time solution for this problem. We then prove the lower bound $Ω(|G|^{1/4})$ for the FS-model and the tight bound $Ω(\sqrt{|G|})$ for the PS-model. This is the first known lower bound for this problem. We obtain similar results for finding a basis for abelian groups. For deterministic algorithms, a simple $Ω(|G|)$ lower bound is given.

cs.CC↗

On Exact Learning of $d$-Monotone Functions

In this paper, we study the learnability of the Boolean class of $d$-monotone functions $f:{\cal X}\to\{0,1\}$ from membership and equivalence queries, where $({\cal X},\le)$ is a finite lattice. We show that the class of $d$-monotone functions that are represented in the form $f=F(g_1,g_2,\ldots,g_d)$, where $F$ is any Boolean function $F:\{0,1\}^d\to\{0,1\}$ and $g_1,\ldots,g_d:{\cal X}\to \{0,1\}$ are any monotone functions, is learnable in time $σ({\cal X})\cdot (size(f)/d+1)^{d}$ where $σ({\cal X})$ is the maximum sum of the number of immediate predecessors in a chain from the largest element to the smallest element in the lattice ${\cal X}$ and $size(f)=size(g_1)+\cdots+size(g_d)$, where $size(g_i)$ is the number of minimal elements in $g_i^{-1}(1)$. For the Boolean function $f:\{0,1\}^n\to\{0,1\}$, the class of $d$-monotone functions that are represented in the form $f=F(g_1,g_2,\ldots,g_d)$, where $F$ is any Boolean function and $g_1,\ldots,g_d$ are any monotone DNF, is learnable in time $O(n^2)\cdot (size(f)/d+1)^{d}$ where $size(f)=size(g_1)+\cdots+size(g_d)$. In particular, this class is learnable in polynomial time when $d$ is constant. Additionally, this class is learnable in polynomial time when $size(g_i)$ is constant for all $i$ and $d=O(\log n)$.

cs.LG↗

Approximating the Number of Relevant Variables in a Parity Implies Proper Learning

Consider the model where we can access a parity function through random uniform labeled examples in the presence of random classification noise. In this paper, we show that approximating the number of relevant variables in the parity function is as hard as properly learning parities. More specifically, let $γ:{\mathbb R}^+\to {\mathbb R}^+$, where $γ(x) \ge x$, be any strictly increasing function. In our first result, we show that from any polynomial-time algorithm that returns a $γ$-approximation, $D$ (i.e., $γ^{-1}(d(f)) \leq D \leq γ(d(f))$), of the number of relevant variables~$d(f)$ for any parity $f$, we can, in polynomial time, construct a solution to the long-standing open problem of polynomial-time learning $k(n)$-sparse parities (parities with $k(n)\le n$ relevant variables), where $k(n) = ω_n(1)$. In our second result, we show that from any $T(n)$-time algorithm that, for any parity $f$, returns a $γ$-approximation of the number of relevant variables $d(f)$ of $f$, we can, in polynomial time, construct a $poly(Γ(n))T(Γ(n)^2)$-time algorithm that properly learns parities, where $Γ(x)=γ(γ(x))$. If $T(Γ(n)^2)=\exp({o(n/\log n)})$, this would resolve another long-standing open problem of properly learning parities in the presence of random classification noise in time $\exp({o(n/\log n)})$.

cs.LG↗

A tight lower bound on non-adaptive group testing estimation

Efficiently counting or detecting defective items is a crucial task in various fields ranging from biological testing to quality control to streaming algorithms. The \emph{group testing estimation problem} concerns estimating the number of defective elements $d$ in a collection of $n$ total within a given factor. We primarily consider the classical query model, in which a query reveals whether the selected group of elements contains a defective one. We show that any non-adaptive randomized algorithm that estimates the value of $d$ within a constant factor requires $Ω(\log n)$ queries. This confirms that a known $O(\log n)$ upper bound by Bshouty (2019) is tight and resolves a conjecture by Damaschke and Sheikh Muhammad (2010). Additionally, we prove similar matching upper and lower bounds in the threshold query model.

cs.DS↗

A Tight Lower Bound of $Ω(\log n)$ for the Estimation of the Number of Defective Items

Let $X$ be a set of items of size $n$ , which may contain some defective items denoted by $I$, where $I \subseteq X$. In group testing, a {\it test} refers to a subset of items $Q \subset X$. The test outcome is $1$ (positive) if $Q$ contains at least one defective item, i.e., $Q\cap I \neq \emptyset$, and $0$ (negative) otherwise. We give a novel approach to obtaining tight lower bounds in non-adaptive randomized group testing. Employing this new method, we can prove the following result. Any non-adaptive randomized algorithm that, for any set of defective items $I$, with probability at least $2/3$, returns an estimate of the number of defective items $|I|$ to within a constant factor requires at least $Ω({\log n})$ tests. Our result matches the upper bound of $O(\log n)$ and solves the open problem posed by Damaschke and Sheikh Muhammad.

cs.DS↗

Improved Lower Bound for Estimating the Number of Defective Items

Let $X$ be a set of items of size $n$ that contains some defective items, denoted by $I$, where $I \subseteq X$. In group testing, a {\it test} refers to a subset of items $Q \subset X$. The outcome of a test is $1$ if $Q$ contains at least one defective item, i.e., $Q\cap I \neq \emptyset$, and $0$ otherwise. We give a novel approach to obtaining lower bounds in non-adaptive randomized group testing. The technique produced lower bounds that are within a factor of $1/{\log\log\stackrel{k}{\cdots}\log n}$ of the existing upper bounds for any constant~$k$. Employing this new method, we can prove the following result. For any fixed constants $k$, any non-adaptive randomized algorithm that, for any set of defective items $I$, with probability at least $2/3$, returns an estimate of the number of defective items $|I|$ to within a constant factor requires at least $$Ω\left(\frac{\log n}{\log\log\stackrel{k}{\cdots}\log n}\right)$$ tests. Our result almost matches the upper bound of $O(\log n)$ and solves the open problem posed by Damaschke and Sheikh Muhammad [COCOA 2010 and Discrete Math., Alg. and Appl., 2010]. Additionally, it improves upon the lower bound of $Ω(\log n/\log\log n)$ previously established by Bshouty [ISAAC 2019].

cs.DS↗

On Detecting Some Defective Items in Group Testing

Group testing is an approach aimed at identifying up to $d$ defective items among a total of $n$ elements. This is accomplished by examining subsets to determine if at least one defective item is present. In our study, we focus on the problem of identifying a subset of $\ell\leq d$ defective items. We develop upper and lower bounds on the number of tests required to detect $\ell$ defective items in both the adaptive and non-adaptive settings while considering scenarios where no prior knowledge of $d$ is available, and situations where an estimate of $d$ or at least some non-trivial upper bound on $d$ is available. When no prior knowledge on $d$ is available, we prove a lower bound of $ Ω(\frac{\ell \log^2n}{\log \ell +\log\log n})$ tests in the randomized non-adaptive settings and an upper bound of $O(\ell \log^2 n)$ for the same settings. Furthermore, we demonstrate that any non-adaptive deterministic algorithm must ask $Θ(n)$ tests, signifying a fundamental limitation in this scenario. For adaptive algorithms, we establish tight bounds in different scenarios. In the deterministic case, we prove a tight bound of $Θ(\ell\log{(n/\ell)})$. Moreover, in the randomized settings, we derive a tight bound of $Θ(\ell\log{(n/d)})$. When $d$, or at least some non-trivial estimate of $d$, is known, we prove a tight bound of $Θ(d\log (n/d))$ for the deterministic non-adaptive settings, and $Θ(\ell\log(n/d))$ for the randomized non-adaptive settings. In the adaptive case, we present an upper bound of $O(\ell \log (n/\ell))$ for the deterministic settings, and a lower bound of $Ω(\ell\log(n/d)+\log n)$. Additionally, we establish a tight bound of $Θ(\ell \log(n/d))$ for the randomized adaptive settings.

cs.DS↗

Almost Optimal Testers for Concise Representations

We give improved and almost optimal testers for several classes of Boolean functions on $n$ inputs that have concise representation in the uniform and distribution-free model. Classes, such as $k$-junta, $k$-linear functions, $s$-term DNF, $s$-term monotone DNF, $r$-DNF, decision list, $r$-decision list, size-$s$ decision tree, size-$s$ Boolean formula, size-$s$ branching programs, $s$-sparse polynomials over the binary field and function with Fourier degree at most $d$. The method can be extended to several other classes of functions over any domain that can be approximated by functions that have a small number of relevant variables.

cs.DS↗

Superpolynomial Lower Bounds for Learning Monotone Classes

Koch, Strassle, and Tan [SODA 2023], show that, under the randomized exponential time hypothesis, there is no distribution-free PAC-learning algorithm that runs in time $n^{\tilde O(\log\log s)}$ for the classes of $n$-variable size-$s$ DNF, size-$s$ Decision Tree, and $\log s$-Junta by DNF (that returns a DNF hypothesis). Assuming a natural conjecture on the hardness of set cover, they give the lower bound $n^{Ω(\log s)}$. This matches the best known upper bound for $n$-variable size-$s$ Decision Tree, and $\log s$-Junta. In this paper, we give the same lower bounds for PAC-learning of $n$-variable size-$s$ Monotone DNF, size-$s$ Monotone Decision Tree, and Monotone $\log s$-Junta by~DNF. This solves the open problem proposed by Koch, Strassle, and Tan and subsumes the above results. The lower bound holds, even if the learner knows the distribution, can draw a sample according to the distribution in polynomial time, and can compute the target function on all the points of the support of the distribution in polynomial time.

cs.DS↗

A Note on Property Testing of the Binary Rank

Let $M$ be a $n\times m$ $(0,1)$-matrix. We define the $s$-binary rank, $br_s(M)$, of $M$ to be the minimal integer $d$ such that there are $d$ monochromatic rectangles that cover all the $1$-entries in the matrix, and each $1$-entry is covered by at most $s$ rectangles. When $s=1$, this is the binary rank,~$br(M)$, known from the literature. Let $R(M)$ and $C(M)$ be the set of rows and columns of~$M$, respectively. We use the result of Sgall (Comb. 1999) to prove that if $M$ has $s$-binary rank at most~$d$, then $|R(M)|\cdot |C(M)|\le {d\choose \le s}2^{d}$ where ${d\choose \le s}=\sum_{i=0}^s{d\choose i}$. This bound is tight; that is, there exists a matrix $M'$ of $s$-binary rank $d$ such that $|R(M')|\cdot |C(M')|= {d\choose \le s}2^{d}$. Using this result, we give a new one-sided adaptive and non-adaptive testers for $(0,1)$-matrices of $s$-binary rank at most $d$ (and exactly $d$) that makes $\tilde O\left({d\choose \le s}2^d/ε\right)$ and $\tilde O\left({d\choose \le s}2^d/ε^2\right)$ queries, respectively. For a fixed $s$, this improves the query complexity of the tester of Parnas et al. (Theory Comput. Syst. 2021) by a factor of $\tilde Θ(2^d)$.

cs.DS↗

Almost Optimal Proper Learning and Testing Polynomials

We give the first almost optimal polynomial-time proper learning algorithm of Boolean sparse multivariate polynomial under the uniform distribution. For $s$-sparse polynomial over $n$ variables and $ε=1/s^β$, $β>1$, our algorithm makes $$q_U=\left(\frac{s}ε\right)^{\frac{\log β}β+O(\frac{1}β)}+ \tilde O\left(s\right)\left(\log\frac{1}ε\right)\log n$$ queries. Notice that our query complexity is sublinear in $1/ε$ and almost linear in $s$. All previous algorithms have query complexity at least quadratic in $s$ and linear in $1/ε$. We then prove the almost tight lower bound $$q_L=\left(\frac{s}ε\right)^{\frac{\log β}β+Ω(\frac{1}β)}+ Ω\left(s\right)\left(\log\frac{1}ε\right)\log n,$$ Applying the reduction in~\cite{Bshouty19b} with the above algorithm, we give the first almost optimal polynomial-time tester for $s$-sparse polynomial. Our tester, for $β>3.404$, makes $$\tilde O\left(\frac{s}ε\right)$$ queries.

cs.LG↗

On Learning and Testing Decision Tree

In this paper, we study learning and testing decision tree of size and depth that are significantly smaller than the number of attributes $n$. Our main result addresses the problem of poly$(n,1/ε)$ time algorithms with poly$(s,1/ε)$ query complexity (independent of $n$) that distinguish between functions that are decision trees of size $s$ from functions that are $ε$-far from any decision tree of size $ϕ(s,1/ε)$, for some function $ϕ> s$. The best known result is the recent one that follows from Blank, Lange and Tan,~\cite{BlancLT20}, that gives $ϕ(s,1/ε)=2^{O((\log^3s)/ε^3)}$. In this paper, we give a new algorithm that achieves $ϕ(s,1/ε)=2^{O(\log^2 (s/ε))}$. Moreover, we study the testability of depth-$d$ decision tree and give a {\it distribution free} tester that distinguishes between depth-$d$ decision tree and functions that are $ε$-far from depth-$d^2$ decision tree. In particular, for decision trees of size $s$, the above result holds in the distribution-free model when the tree depth is $O(\log(s/ε))$. We also give other new results in learning and testing of size-$s$ decision trees and depth-$d$ decision trees that follow from results in the literature and some results we prove in this paper.

cs.DS↗

Optimal Deterministic Group Testing Algorithms to Estimate the Number of Defectives

We study the problem of estimating the number of defective items $d$ within a pile of $n$ elements up to a multiplicative factor of $Δ>1$, using deterministic group testing algorithms. We bring lower and upper bounds on the number of tests required in both the adaptive and the non-adaptive deterministic settings given an upper bound $D$ on the defectives number. For the adaptive deterministic settings, our results show that, any algorithm for estimating the defectives number up to a multiplicative factor of $Δ$ must make at least $Ω\left((D/Δ^2)\log (n/D) \right )$ tests. This extends the same lower bound achieved in \cite{ALA17} for non-adaptive algorithms. Moreover, we give a polynomial time adaptive algorithm that shows that our bound is tight up to a small additive term. For non-adaptive algorithms, an upper bound of $O((D/Δ^2)$ $(\log (n/D)+\log Δ) )$ is achieved by means of non-constructive proof. This improves the lower bound $O((\log D)/(\logΔ))D\log n)$ from \cite{ALA17} and matches the lower bound up to a small additive term. In addition, we study polynomial time constructive algorithms. We use existing polynomial time constructible \emph{expander regular bipartite graphs}, \emph{extractors} and \emph{condensers} to construct two polynomial time algorithms. The first algorithm makes $O((D^{1+o(1)}/Δ^2)\cdot \log n)$ tests, and the second makes $(D/Δ^2)\cdot quazipoly$ $(\log n)$ tests. This is the first explicit construction with an almost optimal test complexity.

cs.IT↗