arXiv subjects

Nannan Mao

Publications and source records attributed to Nannan Mao.

7 recordsLinked to original sources

arXiv2025

Revealing Atomic-Scale Switching Pathways in van der Waals Ferroelectrics

Two-dimensional van der Waals (vdW) materials hold the potential for ultra-scaled ferroelectric (FE) devices due to their silicon compatibility and robust polarization down to atomic scale. However, the inherently weak vdW interactions enable facile sliding between layers, introducing complexities beyond those encountered in conventional ferroelectric materials and presenting significant challenges in uncovering intricate switching pathways. Here, we combine atomic-resolution imaging under in-situ electrical biasing conditions with first-principles calculations to unravel the atomic-scale switching mechanisms in SnSe, a vdW group-IV monochalcogenide. Our results uncover the coexistence of a consecutive 90 degrees switching pathway and a direct 180 degrees switching pathway from antiferroelectric (AFE) to FE order in this vdW system. Atomic-scale investigations and strain analysis reveal that the switching processes simultaneously induce interlayer sliding and compressive strain, while the lattice remains coherent despite the presence of multidomain structures. These findings elucidate vdW ferroelectric switching dynamics at atomic scale and lay the foundation for the rational design of 2D ferroelectric nanodevices.

cond-mat.mtrl-sci↗

arXiv2025

Synthesis-related nanoscale defects in Mo-based Janus monolayers revealed by cross-correlated AFM and TERS imaging

Two-dimensional (2D) Janus transition metal dichalcogenides (TMDs) are promising candidates for various applications in non-linear optics, energy harvesting, and catalysis. These materials are usually synthesized via chemical conversion of pristine TMDs. Nanometer-scale characterization of the obtained Janus materials' morphology and local composition is crucial for both the synthesis optimization and the future device applications. In this work, we present a cross-correlated atomic force microscopy (AFM) and tip-enhanced Raman spectroscopy (TERS) study of Janus $\mathrm{Mo}_{\mathrm{Se}}^{\mathrm{S}}$ and Janus $\mathrm{Mo}_{\mathrm{S}}^{\mathrm{Se}}$ monolayers synthesized by the hydrogen plasma-assisted chemical conversion of $\mathrm{MoSe}_2$ and $\mathrm{MoS}_2$, respectively. We demonstrate how the choice of the growth substrate and the starting TMD affects the morphology of the resulting Janus material. Furthermore, by employing TERS imaging, we demonstrate the presence of nanoscale islands (~20 nm across) of $\mathrm{MoSe}_2$-$\mathrm{Mo}_{\mathrm{Se}}^{\mathrm{S}}$ ($\mathrm{MoS}_2$-$\mathrm{Mo}_{\mathrm{S}}^{\mathrm{Se}}$) vertical heterostructures originating from the bilayer nanoislands in the precursor monolayer crystals. The understanding of the origins of nanoscale defects in Janus TMDs revealed in our study can help with further optimization of the Janus conversion process towards uniform and wrinkle-/crack-free Janus materials. Moreover, our work shows that cross-correlated AFM and TERS imaging is a powerful and accessible method for studying nanoscale composition and defects in Janus TMD monolayers.

cond-mat.mtrl-sci↗

arXiv2024

Non-perturbative cathodoluminescence microscopy of beam-sensitive materials

Cathodoluminescence microscopy is now a well-established and powerful tool for probing the photonic properties of nanoscale materials, but in many cases, nanophotonic materials are easily damaged by the electron-beam doses necessary to achieve reasonable cathodoluminescence signal-to-noise ratios. Two-dimensional materials have proven particularly susceptible to beam-induced modifications, yielding both obstacles to high spatial-resolution measurement and opportunities for beam-induced patterning of quantum photonic systems. Here pan-sharpening techniques are applied to cathodoluminescence microscopy in order to address these challenges and experimentally demonstrate the promise of pan-sharpening for minimally-perturbative high-spatial-resolution spectrum imaging of beam-sensitive materials.

physics.optics↗

arXiv2023

Precise Fermi-level engineering in a topological Weyl semimetal via fast ion implantation

The precise controllability of the Fermi level is a critical aspect of quantum materials. For topological Weyl semimetals, there is a pressing need to fine-tune the Fermi level to the Weyl nodes and unlock exotic electronic and optoelectronic effects associated with the divergent Berry curvature. However, in contrast to 2D materials, where the Fermi level can be controlled through various techniques, the situation for bulk crystals beyond laborious chemical doping poses significant challenges. Here, we report the meV-level ultra-fine-tuning of the Fermi level of bulk topological Weyl semimetal TaP using accelerator-based high-energy hydrogen implantation and theory-driven planning. By calculating the desired carrier density and controlling the accelerator profiles, the Fermi level can be fine-tuned from 5 meV to only $\sim$0.5 meV (DFT calculations) away from the Weyl nodes. The Weyl nodes are preserved, while the carrier mobility is largely retained. Our work demonstrates the viability of this generic approach to tune the Fermi level in semimetal systems and could serve to achieve property fine-tuning for other bulk quantum materials with ultrahigh precision.

cond-mat.mtrl-sci↗

arXiv2021

Revealing the Brønsted-Evans-Polanyi Relation in Halide-Activated Fast MoS2 Growth Towards Millimeter-Sized 2D Crystals

Achieving large-size two-dimensional (2D) crystals is key to fully exploiting their remarkable functionalities and application potentials. Chemical vapor deposition (CVD) growth of 2D semiconductors such as monolayer MoS2 has been reported to be activated by halide salts, yet clear identification of the underlying mechanism remains elusive. Here we provide unambiguous experimental evidence showing that the MoS2 growth dynamics are halogen-dependent through the Brønsted-Evans-Polanyi relation, based on which we build a growth model by considering MoS2 edge passivation by halogens, and theoretically reproduces the trend of our experimental observations. These mechanistic understandings enable us to further optimize the fast growth of MoS2 and reach record-large domain sizes that should facilitate practical applications.

cond-mat.mtrl-sci↗

arXiv2020

Deep-Learning-Enabled Fast Optical Identification and Characterization of Two-Dimensional Materials

Advanced microscopy and/or spectroscopy tools play indispensable role in nanoscience and nanotechnology research, as it provides rich information about the growth mechanism, chemical compositions, crystallography, and other important physical and chemical properties. However, the interpretation of imaging data heavily relies on the "intuition" of experienced researchers. As a result, many of the deep graphical features obtained through these tools are often unused because of difficulties in processing the data and finding the correlations. Such challenges can be well addressed by deep learning. In this work, we use the optical characterization of two-dimensional (2D) materials as a case study, and demonstrate a neural-network-based algorithm for the material and thickness identification of exfoliated 2D materials with high prediction accuracy and real-time processing capability. Further analysis shows that the trained network can extract deep graphical features such as contrast, color, edges, shapes, segment sizes and their distributions, based on which we develop an ensemble approach topredict the most relevant physical properties of 2D materials. Finally, a transfer learning technique is applied to adapt the pretrained network to other applications such as identifying layer numbers of a new 2D material, or materials produced by a different synthetic approach. Our artificial-intelligence-based material characterization approach is a powerful tool that would speed up the preparation, initial characterization of 2D materials and other nanomaterials and potentially accelerate new material discoveries.

cond-mat.mtrl-sci↗

arXiv2017

In-plane uniaxial strain in black phosphorus enables the identification of crystalline orientation

The identification of the crystalline axis of anisotropic black phosphorus (BP) is key for the study of its physical properties and for its optical and electronic applications. Herein, we show that by applying an in-plane uniaxial strain and measuring the changes of Raman shifts, the crystalline axis of BP can be reliably determined. The strain effects on Raman shifts are angle-dependent, which can be expressed as a combination of Raman responses under zigzag and armchair strains. Different from previous polarized optical spectroscopic means, the proposed method does not rely on the laser polarization, the excitation wavelength, the sample thickness and the material of the stretchable substrate. Besides, the effective strain applied on BP from the stretched substrate is estimated, showing that only 20% to 40% of the strain can be effectively transferred to BP flakes from polyethylene terephthalate substrates. Our method provides not only an effective and universal approach to identify the crystalline orientation of layered BP, but also a model to extract additional information in strain-related studies, and can be extended to other 2D anisotropic materials.

cond-mat.mtrl-sci↗