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Nathaniel J. O'Connor

Publications and source records attributed to Nathaniel J. O'Connor.

2 recordsLinked to original sources

Elimination of Flux Trapping in Superconducting Circuits in Ambient Magnetic Fields

Superconductor digital electronics and quantum computing with superconducting qubits are promising next-generation computing technologies. When cooled down or operated in the presence of a nonzero background magnetic field $B_r$, superconducting thin films comprising the circuits can trap magnetic vortices that can degrade circuit or qubit performance. In this work, we report a practical solution for eliminating flux trapped during cooldown in ambient magnetic fields, $B_r\leq 60$ $\upmu$T, based on controlled local thermal gradients and moats, etched holes in the superconducting films of the circuit. Thermal gradients created by integrated on-chip resistive heaters move vortices towards the moats, where they become trapped away from circuitry regions and pinning sites. Using magnetic imaging and electrical circuit readout, we demonstrate that this approach is capable of removing magnetic flux trapped during field cooling and magnetic flux nucleated by circuit operation. If used in an environment with basic magnetic shielding, this solution is capable of suppressing all magnetic flux in a large-scale circuit, overcoming one of the long-standing challenges preventing high-performance scalable computing using superconductors.

cond-mat.supr-con↗

Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope

Magnetic flux trapping is a significant hurdle limiting the reliability and scalability of superconducting electronics, yet tools for imaging flux vortices remain slow or insensitive. We present a cryogenic widefield NV-diamond magnetic microscope capable of rapid, micrometer-scale imaging of flux trapping in superconducting devices. Using this technique, we measure vortex expulsion fields in Nb thin films and patterned strips, revealing a crossover in expulsion behavior between $10$ and $20~μ$m strip widths. The observed scaling agrees with theoretical models and suggests the influence of film defects on vortex expulsion dynamics. This instrument enables high-throughput magnetic characterization of superconducting materials and circuits, providing new insight for flux mitigation strategies in scalable superconducting electronics.

cond-mat.supr-con↗