arXiv subjects

Neal R. Armstrong

Publications and source records attributed to Neal R. Armstrong.

4 recordsLinked to original sources

arXiv2026

Electrochemical reactions under reverse bias create additional mobile ions that enable hole tunneling in metal halide perovskite diodes

Gradual reverse-bias breakdown in metal-halide perovskite diodes and solar cells is thought to originate from hole tunneling through steep bands in an ionic depletion region near the electron transport layer after positively charged iodine vacancies accumulate near the hole-transport layer (HTL). However, typical reported mobile ion concentrations near $1\times10^{17}$ cm$^{-3}$ are too small to quantitatively explain significant tunneling current densities and (Zener) breakdown observed near $-5$ V. Here, we show that inferred mobile ion concentrations increase by more than 100$\times$, to over $1\times10^{18}$ cm$^{-3}$, within just three minutes of reverse bias at $-6.0$ V in p-i-n perovskite diodes. We attribute the increase in mobile ion concentration to iodide oxidation and the resulting iodine vacancy creation which must be balanced by reduction reactions near the HTL. Thin and sub-optimal HTL coverage leads to direct contact between the transparent conducting electrode and perovskite and facilitates electron transfer and reduction, enabling the creation of even larger inferred mobile ion concentrations ($\sim1\times10^{19}$ cm$^{-3}$) and leading to faster degradation under reverse bias. This explains previous work that showed increased breakdown voltages and improved reverse-bias stability by implementing thick, uniform HTLs.

physics.app-ph↗

arXiv2026

Degradation Dynamics of Perovskite Solar Cells Under Fixed Reverse Current Injection

Previous studies of reverse-bias stability in perovskite solar cells have focused primarily on voltage controlled reverse-bias tests. Here we instead present an investigation of perovskite solar cell degradation under well-defined, constant reverse-current stress. We show that the choice of hole-transport layer dictates the dominant degradation pathway: cells using thick poly(triphenylamine) (PTAA) layers with better indium-doped tin oxide (ITO) coverage can tolerate high reverse bias but quickly undergo catastrophic breakdown under fixed reverse current near their one-sun maximum power-point. In contrast, cells modified with the phosphonic-acid interface layer MeO-2PACz, with poorer ITO coverage compared to PTAA, exhibit soft, gradual, and largely recoverable degradation, regardless of the shading conditions. For MeO-2PACz devices, degradation increases with both current magnitude and duration. Importantly, when normalized by injected charge (current times duration), lower currents applied over longer times cause more severe degradation than higher currents over shorter periods. Combining electrical measurements with spatially resolved photoluminescence imaging, we argue against shunt formation and instead support an ion- and charge-mediated interfacial electrochemical degradation mode.

physics.app-ph↗

arXiv2025

Deposition-Dependent Coverage and Performance of Phosphonic Acid Interface Modifiers in Halide Perovskite Optoelectronics

In this work, we study the effect of various deposition methods for phosphonic acid interface modifiers commonly pursued as self-assembled monolayers in high-performance metal halide perovskite photovoltaics and light-emitting diodes. We compare the deposition of (2-(3,6-diiodo-9H-carbazol-9-yl)ethyl)phosphonic acid onto indium tin oxide (ITO) bottom contacts by varying three parameters: the method of deposition, specifically spin coating or prolonged dip coating, ITO surface treatment via HCl/FeCl3 etching, and use in combination with a second modifier, 1,6-hexylenediphosphonic acid. We demonstrate that varying these modification protocols can impact time-resolved photoluminescence carrier lifetimes and quasi-Fermi level splitting of perovskite films deposited onto the phosphonic-acid-modified ITO. Ultraviolet photoelectron spectroscopy shows an increase in effective work function after phosphonic acid modification and clear evidence for photoemission from carbazole functional groups at the ITO surface. We use X-ray photoelectron spectroscopy to probe differences in phosphonic acid coverage on the metal oxide contact and show that perovskite samples grown on ITO with the highest phosphonic acid coverage exhibit the longest carrier lifetimes. Finally, we establish that device performance follows these same trends. These results indicate that the reactivity, heterogeneity, and composition of the bottom contact help to control recombination rates and therefore power conversion efficiencies. ITO etching, prolonged deposition times for phosphonic acids via dip coating, and the use of a secondary, more hydrophilic bis-phosphonic acid, all contribute to improvements in surface coverage, carrier lifetime, and device efficiency. These improvements each have a positive impact, and we achieve the best results when all three strategies are implemented.

physics.app-ph↗

arXiv2020

Approaching the limits of optoelectronic performance in mixed cation mixed halide perovskites by controlling surface recombination

We demonstrate the critical role of surface recombination in mixed-cation, mixed-halide perovskite, FA0.83Cs0.17Pb(I0.85Br0.15)3. By passivating non-radiative defects with the polymerizable Lewis base (3-aminopropyl)trimethoxysilane (APTMS) we transform these thin films. We demonstrate average minority carrier lifetimes > 4 μs, nearly single exponential monomolecular PL decays, and concomitantly high external photoluminescence quantum efficiencies (>20%, corresponding to ~97% of the maximum theoretical quasi-Fermi-level splitting) at low excitation fluence. We confirm both the composition and valence band edge position of the FA0.83Cs0.17Pb(I0.85Br0.15)3 perovskite using multi-institution, cross-validated, XPS and UPS measurements. We extend the APTMS surface passivation to higher bandgap double cation (FA,Cs) compositions (1.7 eV, 1.75 eV and 1.8 eV) as well as the widely used triple cation (FA,MA,Cs) composition and observe significant PL and PL lifetime improvements after surface passivation. Finally, we demonstrate that the average surface recombination velocity (SRV) decreases from ~1000 cm/s to ~10 cm/s post APTMS passivation for FA0.83Cs0.17Pb(I0.85Br0.15)3. Our results demonstrate that surface-mediated recombination is the primary non-radiative loss pathway in MA-free mixed-cation mixed-halide films with a range of different bandgaps, which is a problem observed for a wide range of perovskite active layers and reactive electrical contacts. This study indicates that surface passivation and contact engineering will enable near-theoretical device efficiencies with these materials.

physics.app-ph↗