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Nicholas Eastaugh

Publications and source records attributed to Nicholas Eastaugh.

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Artificial Intelligence for the Characterization of Particles and Fibers by Optical Microscopy

Optical microscopy of particle and fiber dispersions involves interpreting subtle visual cues influenced by specimen morphology, chemical composition, magnification, and illumination conditions. We introduce an artificial intelligence (AI) distillation framework that extracts semantically rich image embeddings from microscopy images using semantic anchors. A multimodal teacher combines each image's visual embedding with three text embeddings representing illumination modality, magnification, and specimen identity and morphology. Generated by LongCLIP's extended-context text encoder, this yields a 2304-dimensional block-structured teacher vector whose component blocks remain physically interpretable throughout training and inference. A student vision transformer (ViT) with a multi-layer perceptron (MLP) decoder is trained to reconstruct this teacher vector from the image alone, minimizing a mean absolute error (L1) loss that enforces coordinate-level fidelity to the teacher's block structure. A cross-entropy term over pseudo-classes derived from HDBSCAN clustering of the teacher embedding space acts as a collapse-prevention regularizer, enforcing inter-cluster separation without requiring contrastive negative mining. At inference, the student operates on image input alone, producing compact embeddings that recover the full semantic content of the teacher vector. The framework achieves approximately 80% pseudo-class validation accuracy and 75% Recall@1 on fine-grained specimen description labels under leave-one-out nearest-neighbor retrieval. These results demonstrate that semantic anchoring enables a vision-only student to acquire richer and more interpretable representations than image-only training, with direct applicability to retrieval, classification, and exploratory analysis of heterogeneous particle and fiber dispersions.

cs.CV

High-Resolution Non-Invasive X-ray Diffraction Analysis of Artists Paints

Energy-dispersive X-ray diffraction (EDXRD) is extremely insensitive to sample morphology when implemented in a back-reflection geometry. The capabilities of this non-invasive technique for cultural heritage applications have been explored at high resolution at the Diamond Light Source synchrotron. The results of the XRD analysis of the pigments in 40 paints, commonly used by 20th century artists, are reported here. It was found that synthetic organic pigments yielded weak diffraction patterns at best, and it was not possible to unambiguously identify any of these pigments. In contrast, the majority of the paints containing inorganic pigments yielded good diffraction patterns amenable to crystallographic analysis. The high resolution of the technique enables the extraction of a range of detailed information: phase identification (including solid solutions), highly accurate unit cell parameters, phase quantification, crystallite size and strain parameters and preferred orientation parameters. The implications of these results for application to real paintings are discussed, along with the possibility to transfer the technique away from the synchrotron and into the laboratory and museum through the use of state-of-the-art microcalorimeter detectors. The results presented demonstrate the exciting potential of the technique for art history and authentication studies, based on the non-invasive acquisition of very high quality crystallographic data.

physics.ins-det