Searcharxiv⌕ Search

arXiv subjects

Nicholas J. Dinsdale

Publications and source records attributed to Nicholas J. Dinsdale.

2 recordsLinked to original sources

Deep learning enabled design of complex transmission matrices for universal optical components

Recent breakthroughs in photonics-based quantum, neuromorphic and analogue processing have pointed out the need for new schemes for fully programmable nanophotonic devices. Universal optical elements based on interferometer meshes are underpinning many of these new technologies, however this is achieved at the cost of an overall footprint that is very large compared to the limited chip real estate, restricting the scalability of this approach. Here, we consider an ultracompact platform for low-loss programmable elements using the complex transmission matrix of a multi-port multimode waveguide. We propose a deep learning inverse network approach to design arbitrary transmission matrices using patterns of weakly scattering perturbations. The demonstrated technique allows control over both the intensity and phase in a multiport device at a four orders reduced device footprint compared to conventional technologies, thus opening the door for large-scale integrated universal networks.

physics.optics↗

Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

Advanced photonic probing techniques are of great importance for the development of non-contact wafer-scale testing of photonic chips. Ultrafast photomodulation has been identified as a powerful new tool capable of remotely mapping photonic devices through a scanning perturbation. Here, we develop photomodulation maps into a quantitative technique through a general and rigorous method based on Lorentz reciprocity that allows the prediction of transmittance perturbation maps for arbitrary linear photonic systems with great accuracy and minimal computational cost. Excellent agreement is obtained between predicted and experimental maps of various optical multimode-interference devices, thereby allowing direct comparison of a device under test with a physical model of an ideal design structure. In addition to constituting a promising route for optical testing in photonics manufacturing, ultrafast perturbation mapping may be used for design optimization of photonic structures with reconfigurable functionalities.

physics.optics↗