arXiv subjects
Publications and source records attributed to Nicolas Dubreuil.
We present a method to measure the spectral density of in-band optical transmission impairments without coherent electrical reception and digital signal processing at the receiver. We determine the method's accuracy by numerical simulations and show experimentally its feasibility, including the measure of in-band nonlinear distortions power densities.
The characterization of a third order nonlinear integrated waveguide is reported for the first time by means of a top-hat Dispersive-Scan (D-Scan) technique, a temporal analog of the top-hat Z-Scan. With a single laser beam, and by carrying two counter-directional nonlinear transmissions to assess the input and output coupling efficiencies, a novel procedure is described leading to an accurate measurement of the TPA figure of merit, the effective Two-Photon Absorption (TPA) and optical Kerr (including the sign) coefficients. The technique is validated in a silicon strip waveguide for which the effective nonlinear coefficients are measured with an accuracy of $\pm 10~\%$
We experimentally show that the self-phase modulation of picosecond pump pulses, induced by both the optical Kerr effect and free-carrier refraction, has a detrimental effect on the maximum on-off Raman gain achievable in silicon on insulator nanowaveguides, causing it to saturate. A simple calculation of the Raman gain coefficient from the measured broadened output pump spectra perfectly matches the saturated behavior of the amplified Raman signal observed experimentally at different input pump powers.