arXiv subjects

Nikolai Röhrich

Publications and source records attributed to Nikolai Röhrich.

4 recordsLinked to original sources

arXiv2026

Tool Verification for Test-Time Reinforcement Learning

Test-time reinforcement learning (TTRL) has emerged as a promising paradigm for Recursive Self-Improving AI (RSI) by adapting Large Reasoning Models (LRMs) on unlabeled test inputs, using self-consensus rewards derived from majority voting over sampled rollouts. However, majority voting can mistake popularity for correctness: a spurious yet high-frequency unverified consensus may become a biased reward signal, causing test-time RL to reinforce frequent but wrong answers and collapse into an incorrect mode. We address this false-popular failure mode with T$^3$RL (Tool-Verification for Test-Time Reinforcement Learning), a verification-aware test-time RL framework. T$^3$RL grounds pseudo-label construction in external tool evidence. Concretely, a verifier utilizes external tool evidence (e.g., from code execution) to upweight verified rollouts during a verification-aware voting, producing more reliable pseudo-labels for training. Across various math difficulties (MATH-500, AMC, and AIME 2024) and diverse backbone families, T$^3$RL significantly improves over TTRL, with better performance on harder problems. T$^3$RL is positioned as a verified online data synthesizer, highlighting the role of tool verification in reliable online adaptation. T$^3$RL is extensible to verifiable domains and provides training and inference efficiency.

cs.AI↗

arXiv2026

Concept Guidance: Precise, Training-Free Latent Control for Text-to-Image Generation

Text-to-image diffusion models have two major drawbacks that severely limit their practical utility: (1) standard models lack an intrinsic mechanism for continuous, concept-specific guidance (e.g., for precisely controlling how aesthetically pleasing an image looks), and (2) they lack reliability for tasks requiring high local coherence (e.g., generating text or human hands). To tackle these issues, we introduce a novel notion of concept-wise mutual information and find large, concept-dependent differences between individual layers, demonstrating that the generation of specific structures is localized in distinct parts of the network. We exploit this insight by reinforcing the impact of concept-relevant layers in Concept Guidance (CoG), a precise, target-specific guidance method that works for models out-of-the-box without additional training, external models, gradients, or prompt engineering. CoG first quantifies each layer's concept-specific impact and then guides denoising using a weighted combination of predictions generated with concept-relevant layers skipped. We demonstrate performance increases across various targets and popular models like PixArt-alpha, SD3, SD3.5, and FLUX.1-dev. Code is available at https://github.com/CompVis/concept_guidance

cs.CV↗

arXiv2026

Preserve the Hard, Regenerate the Rest: Uncertainty-Guided Synthetic Training Data Augmentation with Diffusion Models

Semantic segmentation models struggle with data sparsity and rare or visually diverse regions, e.g., dense regions or small objects in aerial or autonomous mobility data. While synthetic augmentation is an appealing solution, directly generating new labeled data risks misalignment of labels and generated pixels. Existing solutions to this problem often rely on external models, or employ coarse heuristics such as indiscriminately augmenting all foreground objects or entire backgrounds, which wastes capacity on uninformative pixels. To address this, we propose an uncertainty-guided synthetic context augmentation strategy that strictly preserves label validity and efficiently maximizes pixel informativeness per synthetic sample - no external guardrails required. Using a baseline segmenter's predictive entropy, we identify uncertain semantic regions and inpaint only the complementary visual context. When fine-tuning the segmenter on this synthetic data, we compute the loss only over the original pixels, excluding inpainted regions. This focuses learning on the unmodified, uncertain regions while presenting them in novel contexts. We demonstrate substantial mIoU gains on Cityscapes, UAVID, and BDD100K with the largest gains on rare and difficult classes such as buses, trains, or (from the aerial perspective) cars. Our results demonstrate that uncertainty-guided context augmentation is a highly effective lever to improve segmentation performance on complex datasets, with code provided at https://github.com/XITASO/Preserve-the-Hard-Regenerate-the-Rest.

cs.CV↗

arXiv2025

Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics

While transformers have surpassed convolutional neural networks (CNNs) in various computer vision tasks, microelectronics defect detection still largely relies on CNNs. We hypothesize that this gap is due to the fact that a) transformers have an increased need for data and b) (labelled) image generation procedures for microelectronics are costly, and data is therefore sparse. Whereas in other domains, pre-training on large natural image datasets can mitigate this problem, in microelectronics transfer learning is hindered due to the dissimilarity of domain data and natural images. We address this challenge through self pre-training, where models are pre-trained directly on the target dataset, rather than another dataset. We propose a resource-efficient vision transformer (ViT) pre-training framework for defect detection in microelectronics based on masked autoencoders (MAE). We perform pre-training and defect detection using a dataset of less than 10,000 scanning acoustic microscopy (SAM) images. Our experimental results show that our approach leads to substantial performance gains compared to a) supervised ViT, b) ViT pre-trained on natural image datasets, and c) state-of-the-art CNN-based defect detection models used in microelectronics. Additionally, interpretability analysis reveals that our self pre-trained models attend to defect-relevant features such as cracks in the solder material, while baseline models often attend to spurious patterns. This shows that our approach yields defect-specific feature representations, resulting in more interpretable and generalizable transformer models for this data-sparse domain.

cs.CV↗