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Nikolas Mavrikakis

Publications and source records attributed to Nikolas Mavrikakis.

2 recordsLinked to original sources

Geometrically necessary boundaries accommodate the residual elastic strain in cold-rolled Fe-3%Si

The relationship between plastic deformation accommodation structures and residual elastic strain fields in deformed metals is poorly understood at the intragranular scale, largely because no experimental technique has provided simultaneous, three-dimensional, bulk-sensitive access to both fields at the length scale of dislocation boundaries. Here we use dark-field X-ray microscopy (DFXM) to map intragranular misorientation and residual elastic strain simultaneously in three dimensions within a grain of 50% cold-rolled Fe 3%Si alloy. We resolve geometrically necessary boundaries (GNBs) and incidental dislocation boundary (IDB) cell structures in the bulk non-destructively. Correlating the elastic strain field with the segmented plastically deformed substructure reveals that GNBs act as the primary carriers and distributors of long range residual elastic strain. GNBs separate subdomains of distinct mean d-spacing, across the grain volume. The plastic misorientation associated with IDBs and dislocation cells develops within GNB-delimited subdomains that carry comparatively similar values of elastic strain. This supports a mechanistic picture in which GNBs accommodate nearly all the long-range residual elastic strain in the deformed state, while plastic slip propagates into GNB interiors to organize into IDB cells with similar strain levels. The three-dimensional misorientation and strain gradients quantified here provide direct experimental input for recovery and recrystallization modelling in ferritic steels, such as electrical steels.

cond-mat.mtrl-sci

Pink-Beam Dark Field X-ray Microscopy: Expanding 3D/4D Imaging for Complex and Deformed Microstructures

Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of monochromatic DFXM limits its applicability to highly deformed or weakly crystalline structures and constrains time-resolved studies in industrially relevant materials. We present pink-beam DFXM (\pDFXM) at the ID03 beamline of ESRF, achieving a 27-fold increase in diffracted intensity while maintaining 100 nm spatial resolution. We validate \pDFXM{} by imaging a partially recrystallized aluminum grain, confirming sufficient angular resolution for microstructure mapping. The increased flux significantly enhances the diffracted signal, enabling the resolution of subgrain structures. Additionally, we image a highly deformed ferritic iron grain, previously inaccessible in monochromatic mode without focusing optics. Beyond static imaging, \pDFXM{} enables real-time tracking of grain growth during annealing, achieving hundred-millisecond temporal resolution. By combining high photon flux with non-destructive, high-resolution 3D mapping, \pDFXM{} expands diffraction-contrast imaging to poorly diffracting crystals, unlocking new opportunities for studying grain growth, fatigue, and corrosion in bulk materials.

physics.app-ph