arXiv subjects

Nils Axel Henningsson

Publications and source records attributed to Nils Axel Henningsson.

3 recordsLinked to original sources

arXiv2026

Bridging powder and multi-crystal diffraction with basis-adaptive texture tomography

In spatially resolved X-ray diffraction experiments using narrow beams, diffraction patterns from polycrystalline materials often fall between two well-served regimes. Fine-grained, weakly textured microstructures produce smooth Debye-Scherrer rings suited to powder- and tensor-tomography methods, whereas coarse, weakly deformed grains produce isolated spots that can be indexed grain by grain. Many important polycrystalline materials, including plastically deformed metals, martensitic and ferroelastic materials containing complex twin microstructures, and geological aggregates with strong texture or heterogeneous grain size, produce spotty diffraction rings with broadened and overlapping peaks between these limits. Texture tomography addresses this regime by reconstructing spatial orientation distributions from diffraction data. Here, conventional texture tomography lacks the angular resolution needed for sharp distributions, while grain-by-grain indexing can introduce boundary artifacts and underestimate intragranular misorientation. This work introduces basis-adaptive texture tomography. Candidate orientations obtained from peak indexing replace the uniform orientation grid, achieving higher angular resolution. Like conventional texture tomography, it benefits from reconstructing a full orientation distribution function in each voxel, allowing voxels to retain contributions from multiple grains, subgrains or domains rather than being forced into a single orientation. Simulated aluminum polycrystals show improved delineation of grain and sub-grain boundaries accompanied by lower intragranular orientation errors compared with uniform-basis texture tomography and point-by-point scanning 3DXRD. An experimental demonstration on tensile-deformed aluminum shows that bulk grain and subgrain structures with orientation spreads of several degrees can be mapped.

cond-mat.mtrl-sci↗

arXiv2025

Quantifying Resolution in Pink Beam Dark Field X-ray Microscopy: Experiments and Simulations

Pink-beam Dark-Field X-ray Microscopy (pDFXM) is a powerful emerging technique for time-resolved studies of microstructure and strain evolution in bulk crystalline materials. In this work, we systematically assess the performance of pDFXM relative to monochromatic DFXM when using a compound refractive lens (CRL) as the objective. Analytical expressions for the spatial and angular resolution are derived and compared with numerical simulations based on geometrical optics and experimental data. The pink-beam configuration provides an increased diffraction intensity depending on the deformation state of the sample, accompanied by a general tenfold degradation in angular resolution along the rocking and longitudinal directions. This trade-off is disadvantageous for axial strain mapping, but can be advantageous in cases where integrated intensities are needed. For a perfect crystal under parallel illumination with a pink beam, our results show that chromatic aberration is absent, whereas under condensed illumination it becomes significant. The aberration is shown to depend strongly on the local distortion of the crystal. Weak-beam imaging conditions, such as those required for resolving dislocations, are shown to remain feasible under pink-beam operation and may even provide an improved signal-to-noise ratio. The higher incident flux, enhanced by nearly two orders of magnitude, is quantified in terms of beam heating effects, and implications for optimized scanning protocols are discussed.

physics.optics↗

arXiv2025

Bridging Grain Mapping and Dark Field X-ray Microscopy for Multiscale Diffraction Imaging

Resolving how defects emerge and interact within the hierarchical structure of polycrystalline materials remains a core challenge in materials science. Grain-mapping methods such as three-dimensional X-ray diffraction (3DXRD) and diffraction contrast tomography (DCT) provide essential mesoscale context but lack the resolution to image lattice defects. Conversely, high-resolution methods like Dark Field X-ray Microscopy (DFXM) capture lattice distortions but not the surrounding microstructure. Here, we introduce a transferable framework that unifies these complementary approaches into a single, non-destructive workflow. Enabled by open-source software, the method translates grain orientation and position data into precise goniometer settings for DFXM imaging without dismounting or reorienting the sample. Applied to an iron polycrystal containing 1100 grains, DFXM motor positions were calculated for all grains within seconds, enabling on-the-fly targeting of specific grains. This allows reproducible zooming from the millimetre-scale aggregate to individual dislocations. We resolve three-dimensional misorientation fields across grain boundaries with 36 nm pixel size, directly capturing grain-grain interactions within their microstructural context. Finally, we show transferability from LabDCT to synchrotron and XFEL platforms, enabling new ways of studying defect interactions across scales.

physics.app-ph↗