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Olivier Pierron

Publications and source records attributed to Olivier Pierron.

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Phase-field modeling of elastically driven abnormal grain growth

Grain-refined metals typically exhibit high strength, yet their engineering applications are often constrained by grain coarsening under thermo-mechanical loading. Recent experiments have revealed abnormal grain growth (AGG) in ultrafine-grained Ni thin films subjected to cyclic loading at room temperature. Unlike conventional AGG, which generally requires significant plastic deformation or high temperatures, this phenomenon occurs within the regime of macroscopic elastic deformation. This AGG is characterized by the preferential growth of grains with an in-plane <100> orientation aligned with the loading direction. Here, we investigate the underlying physical mechanisms by combining phase-field simulations with micromechanical analysis. The results indicate that elastic energy reduction provides a thermodynamically plausible driving force for this orientation-selective grain growth. Phase-field simulations reveal the evolution kinetics of AGG and confirm that local grain geometry and stress states play critical roles in determining the grain growth pathway. By applying this framework to systems with varying elastic anisotropy, we establish a general approach for investigating elastically driven AGG in polycrystalline materials.

cond-mat.mtrl-sci

NLSTEM: Non-local denoising for enhanced 4D-STEM pattern indexing

4D-STEM-based orientation and phase mapping has enabled rapid microstructure quantification that can be directly combined with standard TEM- and STEM-based imaging modes. Typically, orientation mapping is coupled with beam precession (i.e. precession electron diffraction) to achieve high indexing rates, adding to the cost and often decreasing the spatial resolution of the approach. This paper introduces a new post processing approach modeled after the non-local pattern averaging and reindexing algorithm developed for the electron backscatter diffraction community, wherein post-collection, patterns are averaged using a distance similarity parameter. Results from Ni and Au thin films show that indexing rates can be significantly improved using this post-processing technique due to improved signal-to-noise ratios in the diffraction patterns. Interestingly, the highest indexing rates are achieved in samples heavily damaged via ion irradiation, suggesting that averaging over curved lattices further improves indexing rates.

cond-mat.mtrl-sci