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P. Rivero

Publications and source records attributed to P. Rivero.

2 recordsLinked to original sources

Anomalous charge and negative-charge-transfer insulating state in cuprate chain-compound KCuO_2

Using a combination of X-ray absorption spectroscopy experiments with first principle calculations, we demonstrate that insulating KCuO_2 contains Cu in an unusually-high formal-3+ valence state, the ligand-to-metal (O to Cu) charge transfer energy is intriguingly negative (Delta~ -1.5 eV) and has a dominant (~60%) ligand-hole character in the ground state akin to the high Tc cuprate Zhang-Rice state. Unlike most other formal Cu^{3+} compounds, the Cu 2p XAS spectra of KCuO_2 exhibits pronounced 3d^8 (Cu^{3+}) multiplet structures, which accounts for ~40% of its ground state wave-function. Ab-initio calculations elucidate the origin of the band-gap in KCuO_2 as arising primarily from strong intra-cluster Cu 3d - O 2p hybridizations (t_{pd}); the value of the band-gap decreases with reduced value of t_{pd}. Further, unlike conventional negative charge-transfer insulators, the band-gap in KCuO_2 persists even for vanishing values of Coulomb repulsion U, underscoring the importance of single-particle band-structure effects connected to the one-dimensional nature of the compound.

cond-mat.str-el

Polar catastrophe in ultra-thin limit: A case of rare-earth perovskite LaNiO3

We address the fundamental issue of growth of perovskite ultra-thin films under the condition of a strong polar mismatch at the heterointerface exemplified by the growth of a correlated metal LaNiO$_3$ on the band insulator SrTiO$_3$ along the pseudo cubic [111] direction. While in general the metallic LaNiO$_3$ film can effectively screen this polarity mismatch, we establish that in the ultra-thin limit, films are insulating in nature and require additional chemical and structural reconstruction to compensate for such mismatch. A combination of in-situ reflection high-energy electron diffraction recorded during the growth, X-ray diffraction, and synchrotron based resonant X-ray spectroscopy reveal the formation of a chemical phase La$_2$Ni$_2$O$_5$ (Ni$^{2+}$) for a few unit-cell thick films. First-principles layer-resolved calculations of the potential energy across the nominal LaNiO$_3$/SrTiO$_3$ interface confirm that the oxygen vacancies can efficiently reduce the electric field at the interface.

cond-mat.str-el