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P. Sieberer

Publications and source records attributed to P. Sieberer.

4 recordsLinked to original sources

Optimization and validation of charge transport simulation for hybrid pixel detectors incorporating the repulsion effect

For emerging applications of hybrid pixel detectors which require high spatial resolution, e.g., subpixel interpolation in X-ray imaging and deep learning-based electron localization, accurate modeling of charge transport processes in the sensor is highly demanded. To address this, two open-source, time-stepping Monte Carlo simulation methods have been developed, both explicitly incorporating charge repulsion, which are found necessary for accurate simulation when charge sharing becomes important. The first method employs brute-force calculations accelerated by GPU computing to model charge carrier dynamics, including drift, diffusion, and repulsion. The second utilizes a simplified spherical model that significantly reduces computational complexity. A parameterization scheme of the charge transport behaviors has been developed to enable efficient and rapid generation of X-ray simulation events. Both methods were rigorously validated using experimental data collected with a monochromatic X-ray beam at the METROLOGIE beamline of the SOLEIL synchrotron, demonstrating excellent agreement with measured pixel-energy spectra across various sensor thicknesses, bias voltages, and photon energies. Furthermore, the impact of the repulsion effect on charge carrier distributions was quantitatively evaluated. The potential applications of these simulation methods for different particle detections and detector technologies are also discussed.

physics.ins-det

Enhancing Radiation Hardness and Granularity in HV-CMOS: The RD50-MPW4 Sensor

The latest HV-CMOS pixel sensor developed by the former CERN-RD50-CMOS group, known as the \mpw, demonstrates competitive radiation tolerance, spatial granularity, and timing resolution -- key requirements for future high-energy physics experiments such as the HL-LHC and FCC. Fabricated using a \SI{150}{nm} CMOS process by \emph{LFoundry}, it introduces several improvements over its predecessor, the \emph{RD50-MPW3}, including separated power domains for reduced noise, a new backside biasing scheme, and an enhanced guard ring structure, enabling operation at bias voltages up to \SI{800}{V}. Tests with non-irradiated samples achieved hit detection efficiencies exceeding \SI{99.9}{\%} and a spatial resolution around \SI{16}{\mu m}. Neutron-irradiated sensors were characterized using IV measurements and test-beam campaigns, confirming the sensor's robustness in high-radiation environments. The results highlight the ability of HV-CMOS technology to restore hit detection efficiency post-irradiation by increasing the applied bias voltage. Details of these measurements and timing performance are presented in this paper.

physics.ins-det

Characterization of the RD50-MPW4 HV-CMOS pixel sensor

The RD50-MPW4 is the latest HV-CMOS pixel sensor from the CERN-RD50-CMOS working group, designed to evaluate the HV-CMOS technology in terms of spatial resolution, radiation hardness and timing performance. Fabricated by LFoundry using a 150nm process, it features an improved architecture to mitigate crosstalk, which has been an issue with the predecessor RD50-MPW3, allowing more sensitive threshold settings and full matrix operation. Enhancements include separated power domains for peripheral and in-pixel digital readout, a new backside-biasing step, and an improved guard ring structure supporting biasing up to 500V, significantly boosting radiation hardness. Laboratory measurements and test beam results presented in this paper show significant improvements over its predecessor regarding noise behavior, spatial resolution, and efficiency.

physics.ins-det

Optimizing Charge Transport Simulation for Hybrid Pixel Detectors

To enhance the spatial resolution of the M\"ONCH 25 \textmu m pitch hybrid pixel detector, deep learning models have been trained using both simulation and measurement data. Challenges arise when comparing simulation-based deep learning models to measurement-based models for electrons, as the spatial resolution achieved through simulations is notably inferior to that from measurements. Discrepancies are also observed when directly comparing X-ray simulations with measurements, particularly in the spectral output of single pixels. These observations collectively suggest that current simulations require optimization. To address this, the dynamics of charge carriers within the silicon sensor have been studied using Monte Carlo simulations, aiming to refine the charge transport modeling. The simulation encompasses the initial generation of the charge cloud, charge cloud drift, charge diffusion and repulsion, and electronic noise. The simulation results were validated with measurements from the M\"ONCH detector for X-rays, and the agreement between measurements and simulations was significantly improved by accounting for the charge repulsion.

physics.ins-det